EFFECT OF ROUGHNESS ON RESIDUAL STRESSES MEASURED BY X-RAY DIFFRACTION USING CONVENTIONAL psi/Omega GEOMETRIES
authors Kuznetsov, A; Franca, C; Maru, M; Silva, R; Hirsch, T; Achete, C
editors Gomes, JFS; Meguid, SA
nationality International
journal IRF2016: 5TH INTERNATIONAL CONFERENCE INTEGRITY-RELIABILITY-FAILURE
author keywords Residual stress; X-ray diffraction; roughness
abstract This work investigates the behavior of the residual stress field produced by shot peening process in the samples of AISI 1070 steel as a function of subsequent mechanical polishing of the sample surface. Different depths of the near surface zone were probed by X-ray measurements and respective residual stresses values were confronted with the surface roughness parameter, Ra, varied by mechanical polishing. Three regimes of the sample's thickness variation as a function of surface roughness are identified.
publisher INEGI-INST ENGENHARIA MECANICA E GESTAO INDUSTRIAL
isbn 978-989-98832-5-3
year published 2016
beginning page 733
ending page 734
web of science category Engineering, Mechanical; Materials Science, Multidisciplinary
subject category Engineering; Materials Science
unique article identifier WOS:000388368100117
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times cited (wos core): 0
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