Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy
authors Ivanov, MS; Sherstyuk, NE; Mishina, ED; Khomchenko, VA; Tselev, A; Mukhortov, VM; Paixao, JA; Kholkin, AL
nationality International
journal JOURNAL OF PHYSICS D-APPLIED PHYSICS
author keywords epitaxial ferroelectric film; focused ion beam milling; periodic photonic crystal; ferroelectricity enhancement; piezoresponse force microscopy
keywords PERMITTIVITY; TUNABILITY; RECOVERY; DAMAGE
abstract The local piezoresponse in a Ba0.8Sr0.2TiO3 epitaxial ferroelectric film perforated by cylindrical channels has been investigated experimentally by means of piezoresponse force microscopy (PFM). A large enhancement of the effective values for both lateral and vertical components of piezoelectric tensor was experimentally detected in the perforated film as compared to non-perforated structure-by a factor of 8 for the lateral and by a factor 2 for the vertical piezoresponse. This result is consistent with the previously reported enhancement of the optical second harmonic generation over perforated films observed in macroscopic experiments. We assume that a possible mechanism for the increased PFM response is due to reduction of stress and clamping in the film imposed by the substrate. The obtained insight is critical for understanding nanoscale piezo- and ferroelectric responses in photonic crystals fabricated by focused ion beam milling.
publisher IOP PUBLISHING LTD
issn 0022-3727
isbn 1361-6463
year published 2017
volume 50
issue 42
digital object identifier (doi) 10.1088/1361-6463/aa8604
web of science category Physics, Applied
subject category Physics
unique article identifier WOS:000411793200001
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