Nanomaterial Engineering and Property Studies in a Transmission Electron Microscope
authors Golberg, D; Costa, PMFJ; Wang, MS; Wei, XL; Tang, DM; Xu, Z; Huang, Y; Gautam, UK; Liu, BD; Zeng, HB; Kawamoto, N; Zhi, CY; Mitome, M; Bando, Y
nationality International
journal ADVANCED MATERIALS
author keywords transmission electron microscopy; nanotubes; nanowires; nanosheets
keywords BORON-NITRIDE NANOTUBES; IN-SITU TEM; FILLED CARBON NANOTUBES; GAN-NANOWIRES; TENSILE TESTS; DEFORMATION; NANOSHEETS; TRANSPORT; GRAPHENE; NANOCONTACTS
abstract Modern methods of in situ transmission electron microscopy (TEM) allow one to not only manipulate with a nanoscale object at the nanometer-range precision but also to get deep insights into its physical and chemical statuses. Dedicated TEM holders combining the capabilities of a conventional high-resolution TEM instrument and atomic force -, and/or scanning tunneling microscopy probes become the powerful tools in nanomaterials analysis. This progress report highlights the past, present and future of these exciting methods based on the extensive authors endeavors over the last five years. The objects of interest are diverse. They include carbon, boron nitride and other inorganic one- and two-dimensional nanoscale materials, e.g., nanotubes, nanowires and nanosheets. The key point of all experiments discussed is that the mechanical and electrical transport data are acquired on an individual nanostructure level under ultimately high spatial, temporal and energy resolution achievable in TEM, and thus can directly be linked to morphological, structural and chemical peculiarities of a given nanomaterial.
publisher WILEY-BLACKWELL
issn 0935-9648
year published 2012
volume 24
issue 2
beginning page 177
ending page 194
digital object identifier (doi) 10.1002/adma.201102579
web of science category Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
subject category Chemistry; Science & Technology - Other Topics; Materials Science; Physics
unique article identifier WOS:000298788000005
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  impact metrics
journal analysis (jcr 2017):
journal impact factor 21.950
5 year journal impact factor 21.888
category normalized journal impact factor percentile 97.478
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