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authors |
Marques, L; Silva, MF; Mezouar, M; Hodeau, JL; Nunez-Regueiro, M; Serebryanaya, N; Ivdenko, V; Blank, V; Dubitsky, G |
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editors |
Kuzmany, H; Fink, J; Mehring, M; Roth, S |
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journal |
ELECTRONIC PROPERTIES OF MOLECULAR NANOSTRUCTURES |
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keywords |
HIGH-PRESSURE; C-60; PHASES; FULLERITES; CARBON |
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abstract |
We present synchrotron X-ray diffraction measurements performed on C60 samples quenched from 13GPa and 820K. The analysis of all the reciprocal space of a quenched sample shows that it consists of a 3-D arrangement of polymerised fullerene molecules. Moreover, it is shown that the intensity distribution in reciprocal space occurs in ellipsoidal surfaces instead of the normal spherical surfaces characteristic of a powder sample. This implies that the applied anisotropic stress is imprinted in the quenched transformed samples. |
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publisher |
AMER INST PHYSICS |
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issn |
0094-243X |
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isbn |
0-7354-0033-4 |
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year published |
2001 |
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volume |
591 |
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beginning page |
70 |
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ending page |
73 |
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web of science category |
Materials Science, Multidisciplinary; Physics, Atomic, Molecular & Chemical; Physics, Condensed Matter |
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subject category |
Materials Science; Physics |
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unique article identifier |
WOS:000175483100016
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ciceco authors
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