Anisotropic stress imprinting on 3D C60 polymers
authors Marques, L; Silva, MF; Mezouar, M; Hodeau, JL; Nunez-Regueiro, M; Serebryanaya, N; Ivdenko, V; Blank, V; Dubitsky, G
editors Kuzmany, H; Fink, J; Mehring, M; Roth, S
journal ELECTRONIC PROPERTIES OF MOLECULAR NANOSTRUCTURES
keywords HIGH-PRESSURE; C-60; PHASES; FULLERITES; CARBON
abstract We present synchrotron X-ray diffraction measurements performed on C60 samples quenched from 13GPa and 820K. The analysis of all the reciprocal space of a quenched sample shows that it consists of a 3-D arrangement of polymerised fullerene molecules. Moreover, it is shown that the intensity distribution in reciprocal space occurs in ellipsoidal surfaces instead of the normal spherical surfaces characteristic of a powder sample. This implies that the applied anisotropic stress is imprinted in the quenched transformed samples.
publisher AMER INST PHYSICS
issn 0094-243X
isbn 0-7354-0033-4
year published 2001
volume 591
beginning page 70
ending page 73
web of science category Materials Science, Multidisciplinary; Physics, Atomic, Molecular & Chemical; Physics, Condensed Matter
subject category Materials Science; Physics
unique article identifier WOS:000175483100016
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