Imprinting of anisotropic stress during C-60 high-pressure/high-temperature polymerization process
authors Marques, L; Mezouar, M; Hodeau, JL; Nunez-Regueiro, M
nationality International
journal PHYSICAL REVIEW B
keywords SOLID C60; PHASE; FULLERENE; DETECTOR; CRYSTAL
abstract Synchrotron x-ray two-dimensional diffraction was used to study the evolution of C-60 polymerization in samples quenched from high pressure-high temperature. As for three-dimensional polymers, Debye-Scherrer ellipses are observed at low-pressure conditions, they are disrupted as polymerization progresses indicating an alignment of the growing polymer that finishes in fully textured samples. The anisotropic stress signature on C-60 polymers gives a direct visualization of the permanent imprinting of a mechanical applied field. The anisotropic stress component is an essential factor for C-60 directed polymerization.
publisher AMERICAN PHYSICAL SOC
issn 1098-0121
year published 2002
volume 65
issue 10
digital object identifier (doi) 10.1103/PhysRevB.65.100101
web of science category Physics, Condensed Matter
subject category Physics
unique article identifier WOS:000174548300001
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journal impact factor 3.575
5 year journal impact factor 3.511
category normalized journal impact factor percentile 70.187
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