Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy
authors Romanyuk, K; Luchkin, SY; Ivanov, M; Kalinin, A; Kholkin, AL
nationality International
journal MICROSCOPY AND MICROANALYSIS
author keywords piezoresponse force microscopy; electrochemical strain microscopy; band excitation; multi-frequency detection; signal-to-noise ratio; resonance amplification
keywords ATOMIC-FORCE MICROSCOPY; ELECTROCHEMICAL STRAIN MICROSCOPY; THERMAL NOISE; NANOSCALE; SPECTROSCOPY; CANTILEVERS; DIFFUSION; ANODES; SOLIDS; LIMIT
abstract Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.
publisher CAMBRIDGE UNIV PRESS
issn 1431-9276
year published 2015
volume 21
issue 1
beginning page 154
ending page 163
digital object identifier (doi) 10.1017/S1431927614013622
web of science category Materials Science, Multidisciplinary; Microscopy
subject category Materials Science; Microscopy
unique article identifier WOS:000351763500015
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journal impact factor 2.124
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