Surface potential distribution of multilayer graphene using Kelvin probe and electric-field force microscopies
authors Vidyasagar, R; Camargo, B; Romanyuk, K; Kholkin, AL
nationality International
journal FERROELECTRICS
author keywords Graphene; potential; KPFM; EFM
keywords EPITAXIAL GRAPHENE; SINGLE
abstract Surface properties of multilayer graphene (MLG) were studied by Kelvin Probe and Electric-field Force Microscopies (KPFM and EFM). Using KPFM, we observed an increase in the work function of MLG with increasing thickness. This is attributed to the surface -electrons of p(z) orbitals shifting the Fermi level away from the Dirac point. EFM measurements indicate that the EFM phase increases with DC electric fields (-5V V 5V) applied to the probe. The parabolic phase-shift dependence is pertaining to the electrostatic interaction produced at the tip-MLG interface. These results provide future directions in band-gap engineering of graphene-based devices.
publisher TAYLOR & FRANCIS LTD
issn 0015-0193
year published 2017
volume 508
issue 1
beginning page 115
ending page 123
digital object identifier (doi) 10.1080/00150193.2017.1289583
web of science category Materials Science, Multidisciplinary; Physics, Condensed Matter
subject category Materials Science; Physics
unique article identifier WOS:000399740700015
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journal analysis (jcr 2017):
journal impact factor 0.728
5 year journal impact factor 0.590
category normalized journal impact factor percentile 11.956
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