Tailoring Ferroelectric Properties of 0.37BiScO(3)-0.63PbTiO(3) Thin Films Using a Multifunctional LaNiO3 Interlayer
authors Xiao, JZ; Tomczyk, M; Reaney, IM; Vilarinho, PM
nationality International
journal CRYSTAL GROWTH & DESIGN
keywords LEAD-ZIRCONATE-TITANATE; PIEZOELECTRIC PROPERTIES; ELECTRICAL-PROPERTIES; DIELECTRIC-PROPERTIES; SEED LAYER; CRYSTAL; GROWTH; SI; ELECTRODES; THICKNESS
abstract Functional oxide thin films integrated into complementary metal oxide semiconductor technology often exhibit degraded properties with respect to bulk materials because of complex interfacial phenomena. In this contribution, we demonstrate that a sol-gel LaNiO3 (LNO) interlayer deposited onto the surface of a Pt/TiO2/SiO2/Si substrate prior to growth of sol-gel BiScO3-PbTiO3 (BSPT) films acts: (i) to seed nucleation of perovskite structured; (ii) to template growth to give controlled orientation and enhanced crystallinity; and (iii) as a sink for oxygen vacancies (V-O). The LNO interlayer therefore not only improves the ferroelectric, piezoelectric, and dielectric properties but also reduces leakage current and prevents degradation of the remanent polarization during fatigue tests. We propose that the use of a LNO interfacial layer may offer a generic solution to interfacial degradation in functional oxide films.
publisher AMER CHEMICAL SOC
issn 1528-7483
year published 2018
volume 18
issue 7
beginning page 4037
ending page 4044
digital object identifier (doi) 10.1021/acs.cgd.8b00412
web of science category Chemistry, Multidisciplinary; Crystallography; Materials Science, Multidisciplinary
subject category Chemistry; Crystallography; Materials Science
unique article identifier WOS:000438007200040
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journal impact factor 3.972
5 year journal impact factor 3.880
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