Narrow optical gap ferroelectric Bi2ZnTiO6 thin films deposited by RF sputtering
authors Figueiras, FG; Fernandes, JRA; Silva, JPB; Alikin, DO; Queiros, EC; Bernardo, CR; Barcelay, YR; Wrzesinska, A; Belsley, MS; Almeida, B; Tavares, PB; Kholkin, AL; Moreira, JA; Almeida, A
nationality International
journal JOURNAL OF MATERIALS CHEMISTRY A
keywords PEROVSKITE
abstract This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF- sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic generation. A narrow indirect optical gap of 1.48 eV was measured using optical diffuse reflectance. The ferroelectric domain reversal was further demonstrated through piezo-response force microscopy. This work demonstrates a practical method to fabricate the BZT perovskite phase, without resorting to high pressure and temperature conditions necessary to synthetize the bulk form, with outstanding optical and ferroelectric properties.
publisher ROYAL SOC CHEMISTRY
issn 2050-7488
year published 2019
volume 7
issue 17
beginning page 10696
ending page 10701
digital object identifier (doi) 10.1039/c8ta09425j
web of science category Chemistry, Physical; Energy & Fuels; Materials Science, Multidisciplinary
subject category Chemistry; Energy & Fuels; Materials Science
unique article identifier WOS:000472183200057
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journal analysis (jcr 2017):
journal impact factor 9.931
5 year journal impact factor 9.531
category normalized journal impact factor percentile 92.768
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