Local Electromechanical Response in Doped Ceria: Rigorous Analysis of the Phase and Amplitude
authors Alikin, DO; Slautin, BN; Ushakov, AD; Shur, VY; Mishuk, E; Lubomirsky, I; Tselev, A; Kholkin, AL
nationality International
journal IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
author keywords cerium oxide; electrochemical strain microscopy; electrostriction; oxygen vacancies; phase
abstract Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300 degrees C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.
publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
issn 1070-9878
isbn 1558-4135
year published 2020
volume 27
issue 5
beginning page 1478
ending page 1485
digital object identifier (doi) 10.1109/TDEI.2020.008942
web of science category Engineering, Electrical & Electronic; Physics, Applied
subject category Engineering; Physics
unique article identifier WOS:000588020500016
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journal impact factor 2.554
5 year journal impact factor 2.574
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