Fiber-optic based method for the measurements of electric-field induced displacements in ferroelectric materials
authors Vyshatko, NP; Brioso, PM; de la Cruz, JP; Vilarinho, PM; Kholkin, AL
nationality International
journal REVIEW OF SCIENTIFIC INSTRUMENTS
keywords TITANATE THIN-FILMS; PIEZOELECTRIC COEFFICIENTS; PB(ZR,TI)O-3 FILMS; INTERFEROMETER; CONSTANTS; D(31)
abstract A novel technique for the measurements of electric field-induced displacements in ferroelectric materials is presented. The method relies on a high sensitivity of the fiber-optic probe (Fotonic Sensor (TM), MTI Inc.) that measures the displacement of a specially designed cantilever beam having both electrical and mechanical contact with deforming sample. In this way, the major disadvantages of the standard Fotonic Sensor technique can be avoided. The method provides relatively high sensitivity (down to similar to 4 angstrom), high stability (7% over 8 h), and sufficiently broad frequency range. The capabilities of the proposed measurement setup are validated by the strain measurements in bulk Pb(Zr,Ti)O-3(PZT) ceramics and thin films. (c) 2005 American Institute of Physics.
publisher AMER INST PHYSICS
issn 0034-6748
year published 2005
volume 76
issue 8
digital object identifier (doi) 10.1063/1.1988180
web of science category Instruments & Instrumentation; Physics, Applied
subject category Instruments & Instrumentation; Physics
unique article identifier WOS:000231276600064
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journal analysis (jcr 2017):
journal impact factor 1.428
5 year journal impact factor 1.488
category normalized journal impact factor percentile 37.034
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