Sol-gel reaction stability studied: Influence in the formation temperature and properties of ferroelectric thin films
authors Perez, J; Vilarinho, PM; Kholkin, AL; Almeida, A
nationality International
journal MATERIALS RESEARCH BULLETIN
author keywords Thin film; Sol-gel chemistry; Raman spectroscopy; Ferroelectricity
keywords MEMORY APPLICATIONS; METALLOORGANIC DECOMPOSITION; ELECTRICAL-PROPERTIES; PZT; INTEGRATION; MICROSTRUCTURE; TECHNOLOGY; DEPOSITION
abstract Lead zirconium titanate (PZT) sol-gel solutions were prepared based on distilled lead acetate precursor solutions. A detailed analysis of the distillation effect on the lead precursor and the final PZT solution were carried out by infrared and Raman techniques. It was found that the increase in the number of distillation steps experienced by the lead precursor solutions removes the constitutional water and increases the lead acetate-2-methoxyethanol interconnectivity; thus improving stability and avoiding the aging effect of the resulting PZT solutions. The thermal decomposition process of the PZT solutions was analyzed based on the thermogravimetric (TG) and differential thermogravimetric analysis (DTA) measurements. It was found that as the number of distillation steps in the lead precursor solutions increases, the decomposition rate increases and the formation temperature of pure perovskite PZT films decreases. X-ray diffraction (XRD) technique was used to study the film phase formation. A pure perovskite phase at 500 degrees C was found by the XRD analysis after the second distillation step. Scanning electron microscope technique was used to carry out the microstructural analysis. Dense microstructure Was found in all analyzed films and an incipient columnar grain growth was revealed in PZT films prepared based on lead precursor solution with more than three distillation steps. The dependence of the dielectric, ferroelectric and piezoelectric properties on the number of distillation steps was revealed and a correlation between the distillation process, film microstructure properties and electrical performance was established. (C) 2008 Elsevier Ltd. All rights reserved.
publisher PERGAMON-ELSEVIER SCIENCE LTD
issn 0025-5408
year published 2009
volume 44
issue 3
beginning page 515
ending page 521
digital object identifier (doi) 10.1016/j.materresbull.2008.07.010
web of science category Materials Science, Multidisciplinary
subject category Materials Science
unique article identifier WOS:000263657800007
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journal analysis (jcr 2017):
journal impact factor 2.873
5 year journal impact factor 2.527
category normalized journal impact factor percentile 68.246
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