De-convolution of bulk and interfacial contributions based on impedance spectroscopy with external load resistance
authors Ferreira, AAL; Horovistiz, AL; Abrantes, JCC; Perez-Coll, D; Nunez, P; Frade, JR
nationality International
journal MATERIALS RESEARCH BULLETIN
author keywords Impedance spectroscopy; Electrochemical measurements
keywords STRONTIUM-TITANATE CERAMICS; BRICK LAYER MODEL; GRAIN-BOUNDARIES; CONDUCTIVITY; ZIRCONIA; SPECTRA; SRTIO3
abstract De-convolution of impedance spectra is often ambiguous, mainly due to overlapped contributions, or when a prevailing interfacial contribution raises uncertainties about much smaller bulk contributions at higher frequencies. This can be avoided by performing impedance spectroscopy with a parallel external load resistance, which might exert selective decrease in interfacial contributions, with much smaller changes on high frequency contributions. By suitable selection of a parallel load resistance one obtained clearer interpretation for incompletely resolved high capacitance contributions, especially when the frequency range of the equipment does not reach sufficiently low frequencies. This method is discussed in detail and applied to de-convolution of impedance spectra of selected study cases. This includes ionic, or mixed conductors based on Yb(2)Ti(2)O(7), CGO and strontium titanate. One also provides guidelines for selection of suitable ranges of external resistors. (C) 2008 Elsevier Ltd. All rights reserved.
publisher PERGAMON-ELSEVIER SCIENCE LTD
issn 0025-5408
year published 2009
volume 44
issue 4
beginning page 884
ending page 888
digital object identifier (doi) 10.1016/j.materresbull.2008.09.001
web of science category Materials Science, Multidisciplinary
subject category Materials Science
unique article identifier WOS:000264421200031
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