|
authors |
Marques, L; Mezouar, M; Hodeau, JL; Nunez-Regueiro, M |
|
nationality |
International |
|
journal |
PHYSICAL REVIEW B |
|
keywords |
SOLID C60; PHASE; FULLERENE; DETECTOR; CRYSTAL |
|
abstract |
Synchrotron x-ray two-dimensional diffraction was used to study the evolution of C-60 polymerization in samples quenched from high pressure-high temperature. As for three-dimensional polymers, Debye-Scherrer ellipses are observed at low-pressure conditions, they are disrupted as polymerization progresses indicating an alignment of the growing polymer that finishes in fully textured samples. The anisotropic stress signature on C-60 polymers gives a direct visualization of the permanent imprinting of a mechanical applied field. The anisotropic stress component is an essential factor for C-60 directed polymerization. |
|
publisher |
AMERICAN PHYSICAL SOC |
|
issn |
1098-0121 |
|
year published |
2002 |
|
volume |
65 |
|
issue |
10 |
|
digital object identifier (doi) |
10.1103/PhysRevB.65.100101 |
|
web of science category |
Physics, Condensed Matter |
|
subject category |
Physics |
|
unique article identifier |
WOS:000174548300001
|
