authors |
Esin, AA; Alikin, DO; Turygin, AP; Abramov, AS; Hrescak, J; Walker, J; Rojac, T; Bencan, A; Malic, B; Kholkin, AL; Shur, VY |
nationality |
International |
journal |
JOURNAL OF APPLIED PHYSICS |
keywords |
LEAD-FREE PIEZOCERAMICS; THIN-FILMS; NIOBATE; PERMITTIVITY; CONSTANT; BATIO3; MODEL |
abstract |
The influence of domain walls on the macroscopic properties of ferroelectric materials is a well known phenomenon. Commonly, such "extrinsic" contributions to dielectric permittivity are discussed in terms of domain wall displacements under external electric field. In this work, we report on a possible contribution of charged domain walls to low frequency (10-10(6) Hz) dielectric permittivity in K1-xNaxNbO3 ferroelectric ceramics. It is shown that the effective dielectric response increases with increasing domain wall density. The effect has been attributed to the Maxwell-Wagner-Sillars relaxation. The obtained results may open up possibilities for domain wall engineering in various ferroelectric materials. |
publisher |
AMER INST PHYSICS |
issn |
0021-8979 |
isbn |
1089-7550 |
year published |
2017 |
volume |
121 |
issue |
7 |
digital object identifier (doi) |
10.1063/1.4975341 |
web of science category |
Physics, Applied |
subject category |
Physics |
unique article identifier |
WOS:000395283700010
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ciceco authors
impact metrics
journal analysis (jcr 2019):
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journal impact factor |
2.286 |
5 year journal impact factor |
2.138 |
category normalized journal impact factor percentile |
54.87 |
dimensions (citation analysis):
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altmetrics (social interaction):
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