Alexander Tselev
  Principal Researcher  
  extension: 23145  
  departament: Physics  
  research group: G2 - Multifunctional Ferroic Ceramics and Nanostructures
Short CV

Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)

Professional Experience†
2016–present † Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal
2009–2016 †††† Research Assistant Professor, Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA†
2006–2009 ††† †Research Associate, Duke University, Durham, NC, USA
2003–2006 ††† †Post Doctoral Fellow, Georgetown University, Washington, DC, USA
2001–2003 ††† †Post Doctoral Research Associate, University of Maryland College Park, MD, USA†
1997–2001 ††† †Scientific Employee, Dresden University of Technology, Germany
1991–1997 ††† †Junior Research Scientist, Institute of Applied Physics/Institute for Physics of Microstructures, Russian Academy of Sciences, Russia

Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.

Honors and Awards
European Materials Research Society (E-MRS) Graduate Student Award (1998).
† †
Research Synopsis
1.†† †In-situ Scanning Probe Microscopy of Complex Oxides.† †
In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition/ Laser MBE.

2.†† †Near-field scanning microwave microscopy.
We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors (such as graphene), and structures based on these materials.