Alexander Tselev
  Investigador Principal  
   
  telefone: 234370332  
  extensão: 23101  
  e-mail: atselev@ua.pt  
  departamento: Física  
  gabinete: 13.3.32.4  
   
  grupo: 2 - nanoestruturas e cerâmicos ferróicos multifuncionais
 
  linha: 1 - tecnologias da informação e comunicação
 
  url directo: http://www.ciceco.ua.pt/tselev  
   
Short CV

Education  
Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)
 
Professional Experience 

2016 – present Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal 
2009–2016 Research Assistant Professor, Joint Faculty, Oak Ridge National Laboratory/University of Tennessee, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory and Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 
2006–2009 Research Associate, Duke University, Durham, NC, USA 
2003–2006 Post Doctoral Fellow, Georgetown University , Washington, DC, USA 
2001–2003 Post Doctoral Research Associate, University of Maryland College Park, MD, USA  
1997–2001 Scientific Employee, Dresden University of Technology, Germany 
1991–1997 Junior Research Scientist, Institute of Applied Physics / Institute for Physics of Microstructures, Russian Academy of Sciences, Russia 

Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.
 
Honors and Awards

2017 Tan Chin Tuan Exchange Fellowship in Engineering, Nanyang Technological University, Singapore
European Materials Research Society (E-MRS) Graduate Student Award (1998).
   
Research Synopsis

  1. Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials. 
  2. Near-field scanning microwave microscopy. We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors, including in-situ imaging in fluids.
  3. Physics of nanoscale phase transitions and heat transport
  4. Materials for information storage
  5. Materials for energy storage and conversion 
  6. In-situ Scanning Probe Microscopy of Complex Oxides. In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition / Laser MBE. 
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