Alexander Tselev
  Investigador Principal  
  telefone: 234370332  
  extensão: 23101  
  departamento: Física  
  grupo: 2 - nanoestruturas e cerâmicos ferróicos multifuncionais
  linha: 1 - tecnologias da informação e comunicação
  url directo:  
Short CV

Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)
Professional Experience 
2016–present   Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal
2009–2016      Research Assistant Professor, Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 
2006–2009      Research Associate, Duke University, Durham, NC, USA
2003–2006      Post Doctoral Fellow, Georgetown University, Washington, DC, USA
2001–2003      Post Doctoral Research Associate, University of Maryland College Park, MD, USA 
1997–2001      Scientific Employee, Dresden University of Technology, Germany
1991–1997      Junior Research Scientist, Institute of Applied Physics/Institute for Physics of Microstructures, Russian Academy of Sciences, Russia
Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.
Honors and Awards
European Materials Research Society (E-MRS) Graduate Student Award (1998).
Research Synopsis
1.    In-situ Scanning Probe Microscopy of Complex Oxides.   
In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition/ Laser MBE.
2.    Near-field scanning microwave microscopy.
We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors (such as graphene), and structures based on these materials.

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