Local bias-induced phase transitions
authors Kalinin, SV; Rodriguez, BJ; Jesse, S; Maksymovych, P; Seal, K; Nikiforov, M; Baddorf, AP; Kholkin, AL; Proksch, R
nationality International
journal MATERIALS TODAY
keywords SCANNING PROBE MICROSCOPY; FERROELECTRIC DATA-STORAGE; THIN-FILMS; DOMAIN-STRUCTURES; FORCE MICROSCOPY; SINGLE-CRYSTALS; NANOSCALE; SURFACE; POLARIZATION; EVOLUTION
abstract Electrical bias-induced phase transitions underpin a wide range of applications from data storage to energy generation and conversion. The mechanisms behind these transitions are often quite complex and in many cases are extremely sensitive to local defects that act as centers for local transformations or pinning. Using ferroelectrics as an example, we review methods for probing bias-induced phase transitions and discuss the current limitations and challenges for extending the methods to field-induced phase transitions and electrochemical reactions in energy storage, biological and molecular systems.
publisher ELSEVIER SCI LTD
issn 1369-7021
year published 2008
volume 11
issue 11
beginning page 16
ending page 27
digital object identifier (doi) 10.1016/S1369-7021(08)70235-9
web of science category Materials Science, Multidisciplinary
subject category Materials Science
unique article identifier WOS:000261595500011
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  impact metrics
journal analysis (jcr 2019):
journal impact factor 26.416
5 year journal impact factor 32.072
category normalized journal impact factor percentile 97.293
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