X-ray characterization and domain structure of high-quality SrBi2Ta2O9 single-crystals grown by self-flux solution method
authors Amorin, H; Bdikin, IK; Shvartsman, VV; Costa, MEV; Kholkin, AL
nationality International
journal INTEGRATED FERROELECTRICS
author keywords SrBi2Ta2O9 single-crystals; high temperature self-flux method; x-ray topography analysis; piezoelectric force microscopy; domain structure
keywords FERROELECTRIC PROPERTIES; FAMILY; PHASE
abstract High-quality SrBi2Ta2O9 single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to similar to7 x 5 x 0.05 mm(3) show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (T-c = 350degreesC) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90degrees domains forming due to mechanical twinning above the transition to ferroelectric phase.
publisher TAYLOR & FRANCIS LTD
issn 1058-4587
year published 2004
volume 68
beginning page 259
ending page 268
digital object identifier (doi) 10.1080/10584580490896616
web of science category Engineering, Electrical & Electronic; Physics, Applied; Physics, Condensed Matter
subject category Engineering; Physics
unique article identifier WOS:000226090100028
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journal impact factor 0.557
5 year journal impact factor 0.556
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