Improving the synthesis and properties of SBT thin films by using SBT seeds
authors Aguilar, GG; Costa, MEV; Salvado, IMM
nationality International
journal JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
author keywords thin films; sol-gel process; ferroelectric properties; functional applications
keywords SOL-GEL ROUTE; LOW-TEMPERATURE; PHASE-FORMATION; SRBI2TA2O9; LAYER
abstract Among the different materials studied for ferroelectric applications, SrBi2Ta2O9 (SBT) and SrBi2Nb2O9 (SBN) have deserved a particular interest for the production of non-volatile random access memories (NVFRAMs) due to their fatigue endurance propel-ties. However, the high temperatures required for obtaining these Aurivillius compounds in a straightforward way make necessary to search alternative procedures to synthesize them. In this work the approach of using SBT seeds to improve the synthesis of SBT thin films by a sol-gel procedure is studied and their effects on the thin film properties are evaluated. XRD and SEM analysis of the obtained seeded and unseeded thin films, annealed at different temperatures, show that the use of SBT seeds lowers the crystallization temperature of the perovskite phase and affects the thin film microstructure inducing the development of well defined and more elongated grains. Dielectric and ferroelectric properties are also improved by the seeding procedure. The characteristics of the seeded films annealed at 720 degrees C for 20 min show that the present technique has the advantage of requiring smoother annealing conditions than currently reported methods for producing films with comparable characteristics. (c) 2005 Elsevier Ltd. All rights reserved.
publisher ELSEVIER SCI LTD
issn 0955-2219
year published 2005
volume 25
issue 12
beginning page 2331
ending page 2335
digital object identifier (doi) 10.1016/j.jeurceramsoc.2005.03.052
web of science category Materials Science, Ceramics
subject category Materials Science
unique article identifier WOS:000230569300075
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journal analysis (jcr 2019):
journal impact factor 4.495
5 year journal impact factor 4.283
category normalized journal impact factor percentile 98.214
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