Scanning probe microscopy (SPM) or Atomic Force Microscopy (AFM) is one of the most advanced microscopy methods that forms images of surfaces using a physical probe that scans the specimen. CICECO has currently four dedicated microscopes (3 from NT-MDT and 1 from Park Systems) that can be used for studying materials and nanostructures with a resolution down to a few nanometers
The microscopes can work in ambient conditions as well as in vacuum (10-5 torr), gas atmosphere, and low oxygen and humidity conditions (glovebox). The temperature range is from room temperature up to about 200 oC. Magnetic option allows applying an external DC magnetic field up to 0.3 T.
Available modes: Contact, Tapping, Phase Imaging, Lateral Force Microscopy, Force-Distance, Piezoresponse Force Microscopy, Electrostatic Force Microscopy, Kelvin Force Microscopy, Force Modulation Microscopy, Magnetic Force Microscopy, Conductive AFM, Scanning Thermal Microscopy, Scanning Tunneling Microscopy, Nanolithography etc. PinPoint mode of Park Microscope provides accurate and quantitative nanomechanical images via fast force spectroscopy mapping. Besides the acquisition of nanomechanical properties, including adhesion force and elastic modulus, the controlled contact force and time in PinPoint allows more accurate and less invasive electrical and electromechanical imaging.
About Atomic Force Microscopy Facility
Atomic Force Microscopy (AFM) measurements (all common modes) of solid organic/inorganic materials:
- Topography imaging in contact, non-contact, tapping, and PinPoint (https://www.parksystems.com/products/park-afm-modes/nanomechanical-modes?i=0) modes.
- Force-distance curves.
- Piezoresponse Force Microscopy (PFM) imaging of functional materials (piezoelectrics and ferroelectrics) with time and voltage spectroscopy options (DC bias voltages from 0 to ±200 V).
- Electrochemical Strain Microscopy (ESM) of solid ionic conductors (SIC) and mixed ionic electronic conductors (MIEC) including Li-battery cathodes and thin-film batteries.
- Magnetic Force Microscopy (MFM) of magnetic materials.
- Kelvin Probe Force microscopy (KPFM).
- Conductive Atomic Force Microscopy (c-AFM).
- Scanning Spreading Resistance Microscopy (SSRM).
- Scanning Thermal Microscopy (SThM).
Standard samples can be in the form of solid films, single crystals, ceramics, nano- and microfibers, and particles fixed on a solid substrate (typically metal disks). The maximum size of the samples is 15x15 mm2. Scanning range up to 100?100?10 µm (X,Y,Z).
The measurements are possible in ambient atmosphere conditions, as well as, in controlled environment of the glovebox and in vacuum at a pressure better than 10-5 torr. Some microscopes are equipped with Hybrid mode (https://ntmdt.nl/home/learning/applications/087_expanding-afm-with-hd-mode/) for the nanomechanical imaging of soft samples.
Services (internal and external) are provided for all AFM techniques but prior authorization by the scientific coordinator (Dr. Kholkin, kholkin@ua.pt) is required. The booking is mandatory via an online calendar.
Routine AFM tasks using simple operational modes (e.g. topography imaging in contact, noncontact regime, phase imaging, etc) can be implemented either with technical support by Dr. Romanyuk (k.romanyuk@ua.pt) or by the user after additional training.
Advanced AFM techniques require specialized technical support and prior consultation with the responsible person (kholkin@ua.pt) who will provide further insight into the use of specific AFM modes to solve the scientific problem.
Submit the form below with your enquiry.
Andrei Kholkin
Scientific Coordinator
Konstantin Romanyuk
Laboratory Researcher
Instruments
High vacuum atomic force microscope for atmosphere-sensitive materials research
All modes + vacuum better than 1 x 10-5 torr.
Link to: https://www.parksystems.com/products/high-vacuum-afm/park-nx-hivac
All modes + measurements in the glovebox with Ar atmosphere (low humidity and oxygen partial pressure)
The AFM is equipped with a homemade head and external HF2LI lock-in amplifier (Zurich Instruments).
Limited number of modes, preferably for topography measurements.
Link to: https://www.ntmdt-si.com/products/atomic-force-microscopes/next-ii