Narrow optical gap ferroelectric Bi2ZnTiO6 thin films deposited by RF sputtering


This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF- sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic generation. A narrow indirect optical gap of 1.48 eV was measured using optical diffuse reflectance. The ferroelectric domain reversal was further demonstrated through piezo-response force microscopy. This work demonstrates a practical method to fabricate the BZT perovskite phase, without resorting to high pressure and temperature conditions necessary to synthetize the bulk form, with outstanding optical and ferroelectric properties.




Chemistry; Energy & Fuels; Materials Science


Figueiras, FG; Fernandes, JRA; Silva, JPB; Alikin, DO; Queiros, EC; Bernardo, CR; Barcelay, YR; Wrzesinska, A; Belsley, MS; Almeida, B; Tavares, PB; Kholkin, AL; Moreira, JA; Almeida, A

nossos autores


This work was supported by national funds through the Portuguese Foundation for Science and Technology (FCT/MEC) and COMPETE 2020. when appropriate, co-financed by FEDER under the PT2020 Partnership Agreement: Grants SFRH/BPD/80663/2011 and SFRH/BPD/92896/2013; Projects IFIMUP-IN: Norte-070124-FEDER-000070; CICECO-AIM: POCI-01-0145-FEDER-007679, PTDC/FIS-NAN/0533/2012, UID/CTM/50011/2013, UID/FIS/04650/2013, CERN/FIS/NUC/0004/2015 and NECL: NORTE-01-0145-FEDER-022096 and UID/NAN/50024/2019. Foundation CAPES through the project PNPD-UFAM/Fisica/1671526 is also acknowledged.

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