resumo
Ti-rich PbZr1-xTixO3 (x = 0.65, PZT65) single crystals with the dimensions of 1 x 1 x 0.2 mm(3) were grown by the self-flux method. Micron-sized ferroelectric domains were observed and characterized via piezoresponse force microscopy (PFM) and switching spectroscopy PFM. Both out-of-plane and in-plane components of polarization were obtained by detecting vertical and lateral vibrations of the PFM cantilever. The piezoresponse image examination revealed a clear lamellar domain structure due to apparent twinning and the formation of 90 degrees domains. A negative self-polarization was observed in the studied crystals leading to the asymmetry of piezoresponse hysteresis loops and the polarization imprint. The polarization switching mechanism under the external electric field applied via a PFM tip was investigated. The 90 degrees domain wall width was determined from the local PFM measurements and tentatively attributed to the oblique domain walls and chemical disorder. The time-dependent PFM imaging revealed a slow polarization relaxation process with a characteristic time of about 200 min. (C) 2011 American Institute of Physics. [doi:10.1063/1.3623768]
palavras-chave
LEAD-ZIRCONATE-TITANATE; THIN-FILMS; ATOMIC-FORCE; RELAXATION MECHANISMS; ELECTRON-MICROSCOPY; IMPRINT BEHAVIOR; WALLS; THICKNESS; BATIO3; CONFIGURATIONS
categoria
Physics
autores
Bdikin, IK; Perez, JA; Coondoo, I; Senos, AMR; Mantas, PQ; Kholkin, AL
nossos autores
Ana Maria de Oliveira e Rocha Senos
Colaborador
Andrei Kholkin
Investigador Jubilado
Indrani Coondoo
Investigador Júnior