resumo
Lead zirconate titanate Pb(Zr0.50Ti0.50)O-3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films. PZT films pyrolyzed at temperatures higher than 350 degrees C present a coexistence of pyrochlore and perovskite phases, while only perovskite phase grows in films pyrolyzed at temperatures lower than 300 degrees C. For pyrochlore-free PZT thin films, a small (100)-orientation tendency near the film-substrate interface was observed. Finally, we demonstrate the existence of a self-polarization effect in the studied PZT thin films. The increase of self-polarization with the film thickness increasing from 200 nm to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-substrate interface are not primarily responsible for the observed self-polarization effect in our films. (C) 2013 AIP Publishing LLC
palavras-chave
X-RAY-DIFFRACTION; RIETVELD REFINEMENT; PBZR1-XTIXO3 PZT; IMPRINT BEHAVIOR; DEPOSITION; POLARIZATION; PYROCHLORE; CAPACITORS; KINETICS; POWDER
categoria
Physics
autores
Araujo, EB; Lima, EC; Bdikin, IK; Kholkin, AL
nossos autores
Andrei Kholkin
Investigador Principalagradecimentos
We would like to express our gratitude to the Brazilian agencies FAPESP (Processes Nos. 2007/08534-3 and 2010/16504-0), CNPq (Research Grant No. 307607/2009-7 and Project No. 490436/2011-0), and CAPES (Project AUXPE-PNPD, No. 2392/2009) for their financial support. Center for Research on Ceramic and Composite Materials (CICECO) of the University of Aveiro is acknowledged for the support.