The Atomic Force Microscopy Facility is a core facility providing access to advanced scanning probe microscopy techniques for nanoscale surface and functional characterization of materials.
The facility integrates instrumentation located at the Department of Physics and the Department of Materials and Ceramic Engineering, supporting research activities through advanced imaging, surface analysis and nanoscale characterization techniques.
Available instrumentation
- Solver Next AFM, NT-MDT (Department of Physics)
- AFM Park Systems, Model FX40 (Department of Materials and Ceramic Engineering)
- AFM Bruker / Veeco, Model Nanoscope IIIA Multimode (Department of Materials and Ceramic Engineering)
- 3D Optical Profilometer, Sensofar, Model S Neox (Department of Materials and Ceramic Engineering)
About Atomic Force Microscopy Facility @ Physics Department
The facility offers topographic imaging modes as well as surface potential imaging modes under ambient conditions. The main microscope is an automated AFM for samples up to 20 mm in diameter and up to 10 mm in height.
Supported imaging modes
- Contact AFM
- Semi-contact / Intermittent contact AFM (tapping / AM-AFM)
- Lateral Force Microscopy (LFM)
- Electrostatic Force Microscopy (EFM)
- Kelvin Probe Force Microscopy (KPFM)
Internal users from CICECO and the University of Aveiro can access the facility through the scientific collaboration framework.
Facility staff contribute scientifically, including experimental design and planning, sample preparation, measurements, data analysis and interpretation. Co-authorship is expected when contributions meet academic authorship criteria.
Routine tasks, such as topography imaging in contact or non-contact regimes, can be carried out by users after appropriate training.
External users outside the University of Aveiro are welcome to access the facility through a service model, where measurements and analyses are performed for a fee.
This model does not involve scientific collaboration or authorship. However, for industrial and academic users, access can also be provided through the scientific collaboration framework upon mutual agreement.
Alexander Tselev
Scientific Coordinator
Principal Researcher at CICECO and Department of Physics. His main scientific interests include the application and development of scanning probe microscopy imaging modalities for nanoscale functional characterization of materials.
Instruments
The microscope is an automated AFM for samples up to 20 mm in diameter and up to 10 mm in height. It offers topographic imaging modes as well as surface potential imaging modes under ambient conditions.
The X, Y and Z scanners are equipped with feedback position sensors to ensure low non-linearity in sample and probe positioning. The XY scan area is 100 x 100 µm2. The measurable height (Z) range is 10 µm, with a noise level below 0.1 nm RMS in the 10–1000 Hz band. The lateral spatial resolution is determined by the scanning probe radius.
Automation features
- Cantilever recognition and automatic laser alignment
- Autofocus
- Panoramic optical field of view up to 5 x 5 mm2
- Point-and-click motorized precise sample positioning
- Gentle probe engagement procedure and automatic feedback loop adjustment
Technical data
- Sample size: up to 20 mm in diameter and up to 10 mm in height
- Sample weight: up to 40 g
- Type of scanning: by sample
- Scanning area: 100 x 100 x 10 µm, with feedback sensors
- Nonlinearity, XY: 0.1%, with feedback sensors
- Noise XY: less than 0.3 nm, with feedback sensors
- Noise level Z: typically 0.03 nm RMS in the 10–1000 Hz band, with feedback sensors
- Sample positioning system
The manufacturer’s presentation of the microscope can be found at: https://youtu.be/6rzDZ_JzV-c
About Atomic Force Microscopy Facility @ Materials and Ceramic Engineering Department
There are no human resources allocated to the equipment. All work should be under a self-use regime, after initial training with an established user.
There are no consumables allocated to the equipment. AFM tips and tip holders must be acquired by each user.
Contact the scientific coordinator or one of the “staff” members. Analysis will be done case by case.
Calendar
Contact the scientific coordinator or one of the “staff” members.
Instruments
Atomic Force Microscope, Park Systems, Model FX40
Core Performance & ScannersIndependent orthogonal XY and Z flexure-based scanners designed to eliminate scanner bow and axis crosstalk.
XY scan range: up to 100 µm × 100 µm.
Z scan range: 15 µm.
Z-detector noise level: < 0.02 nm RMS.
Typical Z height noise: < 0.03 nm at 0.5 kHz bandwidth.
XY resolution: up to 0.15 nm.
Sample Specifications
Samples up to 50 mm × 50 mm can be measured.
Samples up to 19 mm in height can be analysed.
In liquid-cell configuration, samples up to 5 mm in height can be measured.
Automation & Intelligent Features
Automated Probe Exchange (ATX) system with robotic handling of up to 8 probes.
Integrated QR-code probe identification system for automatic loading of probe information.
Machine-learning-based automatic laser beam and PSPD alignment.
SmartScan™ autonomous imaging system for real-time optimization of scan speed and feedback parameters.
Imaging Modes
Supported modes include True Non-Contact™, Tapping, Contact, Lateral Force Microscopy (LFM), Phase Imaging, PinPoint™, Force-Distance Spectroscopy, Nanoindentation, Kelvin Probe Force Microscopy (KPFM), Conductive AFM (C-AFM), Magnetic Force Microscopy (MFM), and Piezoresponse Force Microscopy (PFM).
Environmental & Atmospheric Control
The system is mounted on an Active Vibration Isolation Table for suppression of low-frequency vibrations and sub-angstrom resolution measurements.
Integrated environmental sensors monitor temperature, humidity, and vibration conditions.
The FX40 is integrated with an acrylic glovebox system for controlled-atmosphere measurements.
The glovebox supports N2, Ar, and He atmospheres with working pressure control of ±12 mbar.
Humidity control range: 20% to 80% RH.
Internal EMI shielding minimizes electromagnetic interference during electrical measurements.
Liquid & Electrochemical Analysis
Specialized liquid cells and probes enable high-resolution imaging in aqueous and organic solvents.
The EC-cell allows in-situ electrochemical AFM (EC-AFM) for monitoring surface morphology changes during electrochemical reactions.
Optics & Safety
5.1 megapixel digital camera with motorized focus and field of view up to 840 µm × 630 µm.
Integrated head-crash avoidance system using hardware and software interlocks.
Sample Handling
Multi-sample snap-in chuck supporting up to 4 samples simultaneously.
This Bruker Multimode AFM, formerly Veeco / Digital Instruments, operates with a Nanoscope IIIA controller, Nanoscope version 5.2 software, and a J scanner with a scan range of 125 µm × 125 µm × 5.0 µm.
Sample Specifications
Samples up to 5 mm thick are mounted onto a 15 mm diameter disc, with access to an area of approximately 2–3 mm at the centre of the sample.
Environmental Isolation
The microscope is installed on a vibration isolation platform and enclosed within a metallic casing to minimize external interferences during measurement.
Imaging Modes
Compatible with standard and advanced AFM scan modes, including Contact Mode, Tapping Mode, Phase Imaging, Magnetic Force Microscopy (MFM), Force-Curve Measurement, Lateral Force Microscopy (LFM), and Electrostatic Force Microscopy (EFM).
3D Optical Profilometer, Sensofar, Model S Neox
General InformationBrand: Sensofar
Model: S neox
Room: 3.4.22
Acquisition year: 2014
Measurement Techniques
Dark and light field microscopy, Focus Variation (FV), Confocal (Co), PSI (Phase Shifting Interferometry), and VSI (Vertical Scanning Interferometry).
Optical Objectives
Confocal, FV, Optical Microscopy: 10x, 20x, 50x, 100x.
VSI and PSI: 10x, 50x.
Vertical Resolution
Confocal mode: 25 nm (10x), 3 nm (50x), and < 1 nm with piezo stage.
VSI: 1 nm.
PSI: 0.01 nm.
Lateral Resolution
0.15 µm (100x) and 0.25 µm (50x) for interferometry.
Maximum Sample Dimensions
40 mm height × 150 mm × 150 mm.
Data Analysis
SensoMap software.