The Electron Microscopy Service of Universidade de Aveiro (SME@UA) is a common use facility of the Centre for Imaging and Structure of Materials (CEIM) of CICECO - Aveiro Institute of Materials. The main goal is to support high-quality research by providing microstructural, structural and chemical analysis, and by training users, while giving access to the entire Universidade de Aveiro’s research community and to external private and public entities.
The SME@UA manages, in an integrated way, the following medium and large-scale pieces of equipment:
Transmission Electron Microscopy:
- STEM Hitachi, Model HD2700;
- TEM Jeol, Model 2200 FS;
- TEM Hitachi, Model H9000;
Scanning Electron Microscopy:
- SEM Hitachi, Model SU-70;
- SEM Hitachi, Model S4100;
Other:
- 3D Optical Profilometer, Sensofar, Model S Neox;
About Electron Microscopy Facility
External users will need to send us an email to create an account.
Rules at http://www2.cv.ua.pt/info_regras.asp
Filipe Oliveira
Scientific Coordinator
Violeta Girão
Laboratory Researcher
Marta Ferro
Laboratory Technician
Instruments
HR–TEM200–SE/EDS: HR-(EF)TEM marca JEOL, modelo 2200FS e EDS marca Oxford, modelo INCA Energy TEM 250
Transmission electron microscope energy-filtered TEM EF 200kV, JEOL brand, model 2200FS, high-resolution electron gun Schottky emission (SE), omega type energy filter column spectrometry with electron energy loss EELS, Integrated STEM mode of operation, equipped with energy dispersive microanalysis of Raios-X/EDS, slow-scan CCD camera, refrigeration unit closed water circuit, and with the following characteristics:
Electro-optical system with electron gun Schottky emission (SE) • maximum acceleration voltage: 200kV • Point resolution: 0.19 nm • resolution of network: 0.10 nm; Omega energy filter type column: • Picture modes of energy filtered TEM and STEM • Spectroscopy of electron energy loss EELS Vacuum System and automatic water cooling in a closed system; Detectors: • Detector electrons transmitted low angle (BF) STEM scanning device; • Detector ring of electrons transmitted high-angle (HAADF); • Digital Camera, model SC1000B, Orius, with image capture real-time digital video recording; Tilt ± 25 ° sample at the point eucêntrico; Trapa cold ("Cold Trap") and cold finger ("Cold Finger"); Software analysis / simulation of electron difractogramas single crystal and polycrystalline and software analysis / simulation of images of atomic network. Electronic control console operation • Analog Console • Scanning System and digital image capture Computer System for TEM, consists of: • Two computers with Windows operating system • Two monitors 17 "Flat • DVD / CD-RW and network ports
Microanalysis System for X-ray spectrometry energy dispersive (EDS), Oxford brand, model INCA Energy TEM 250 with the following characteristics:
X-ray detector, • Resolution: 136 eV • Window: 30 mm2 Processor X-Ray Bursts; Integrated operation with TEM and achievement profiles and maps of X-rays; "Shutter" –Retainer of electrons to "spot" main diffraction; Software processing and analysis of X-ray spectra: • Qualitative Analysis; • Quantitative Analysis without standards and standards, and delayed analysis • Automatic program for analysis of lines, points and network; • Program "Site Lock"; Software EDS data processing for use in stand-alone computer; Computer System for EDS consists of: • Computer and operating system • Monitor 17 "Flat • DVD / CD-RW, network ports and printer
HR-SEM-SE/EDS: SEM marca Hitachi, modelo SU-70 e EDS marca Bruker, modelo QUANTAX 400
Scanning electron microscope SEM, analytical and high resolution Schottky emission (SE), the Hitachi brand, model SU-70, equipped with detectors for secondary and backscattered electrons, energy dispersive microanalysis of raios-X/EDS, unity cooling water circuit closed with the following characteristics:
Electron gun: Schottky emission (SE). Resolution: 1 nm at 15 kV, 4 mm WD Increases: the x30 x800.000 Accelerating voltage: 0.1 to 30 kV. Detectors: • Two secondary electron detectors, normal position and "in-lens". • Detector electron back-scattered "in-lens". • Function of deceleration. • Meter beam current 100nA-1PA. Automatic vacuum system vibration-free Four diaphragms objective lens controllable by the operator, with heating Pre-vacuum chamber for sample introduction: • Sample size up to 150 mm in diameter and 6 mm thick. • communication between the valve chamber and activated by the pre-chamber vacuum level Sample chamber: • Diameter greater than 100 mm • 15 ports for accessories Eucêntrica platinum sample holder, with 5-axis motorized: • –Displacement in X: 110 mm. • –Shift Y: 110 mm. • –Displacement in Z: 40 mm. • –Rotation: 360 degrees. • –Tilt: -5 to +70 º (-45 º R). • door lock system of the sample vibration Electronic control console operation: • Control panel multifunctional. • Automated functions: auto-focus, auto-astigmatism auto-brilho/contraste, with parameters adapted by the user. • Memory working conditions and coordinates. Image processor, high-resolution (5120 x 3840 pixels) Control operation: Environment • Windows XP, • 19 inch TFT Monitor, • Digital recording DVD / CD-RW, network ports and photo quality printer.
Microanalysis system for energy dispersive spectrometry of raios-X/EDS, Bruker brand, model QUANTAX 400, with the following characteristics:
XFlash 4010 detector of light elements (BU) cooled by Peltier: • Resolution? 133 eV (MNK, 1000 cps). • Processing capacity Pulse: up to 275,000 cps output • High stability of the energy scale. Integrated operation with the SEM and profiling and X-ray maps • Processing and deconvolution of spectra. • Quantitative analysis –identification and measurement of peak intensities. • quantitative analysis without standards and standards, deferred analysis. Computer system • Windows XP Environment • 19 inch TFT Monitor, • Digital recording, network ports and printer color photo quality
Sensofar, S Neox
Room: 3.4.22