Publications
Tailoring Ferroelectric Properties of 0.37BiScO(3)-0.63PbTiO(3) Thin Films Using a Multifunctional LaNiO3 Interlayer
Xiao, JZ; Tomczyk, M; Reaney, IM; Vilarinho, PM
2018, CRYSTAL GROWTH & DESIGN, 18, 7, 4037-4044.
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Interface-based reduced coercivity and leakage currents of BiFeO3 thin films: A comparative study
Tomczyk, M; Mahajan, A; Tkach, A; Vilarinho, PM
2018, MATERIALS & DESIGN, 160, 1322-1334.
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Growth of BiFeO3 thin films by chemical solution deposition: the role of electrodes
Tomczyk, M; Stroppa, DG; Reaney, IM; Vilarinho, PM
2017, PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 19, 22, 14337-14344.
ISBN:
1463-9084
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Direct fabrication of BiFeO3 thin films on polyimide substrates for flexible electronics
Tomczyk, M; Bretos, I; Jimenez, R; Mahajan, A; Ramana, EV; Calzada, ML; Vilarinho, PM
2017, JOURNAL OF MATERIALS CHEMISTRY C, 5, 47, 12529-12537.
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Oxygen-storage behavior and local structure in Ti-substituted YMnO3
Levin, I; Krayzman, V; Vanderah, TA; Tomczyk, M; Wu, H; Tucker, MG; Playford, HY; Woicik, JC; Dennis, CL; Vilarinho, PM
2017, JOURNAL OF SOLID STATE CHEMISTRY, 246, 29-41.
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Active layers of high-performance lead zirconate titanate at temperatures compatible with silicon nano- and microelecronic devices
Bretos, I; Jimenez, R; Tomczyk, M; Rodriguez-Castellon, E; Vilarinho, PM; Calzada, ML
2016, SCIENTIFIC REPORTS, 6.
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Polarization switching at room temperature of undoped BiFeO3 thin films crystallized at temperatures between 400 <= T <= 500 degrees C
Perez-Rivero, A; Tomczyk, M; Jimenez, R; Bretos, I; Ricote, J; Vilarinho, PM; Calzada, ML
2015, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 26, 12, 9373-9386.
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Origin of microcracking in YMnO3 ceramics
Tomczyk, M; Senos, AM; Vilarinho, PM; Reaney, IM
2012, SCRIPTA MATERIALIA, 66, 5, 288-291.
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Reduction of microcracking in YMnO3 ceramics by Ti substitution
Tomczyk, M; Senos, AMOR; Reaney, IM; Vilarinho, PM
2012, SCRIPTA MATERIALIA, 67, 5, 427-430.
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High temperature dielectric properties of YMnO3 ceramics
Tomczyk, M; Vilarinho, PM; Moreira, A; Almeida, A
2011, JOURNAL OF APPLIED PHYSICS, 110, 6.
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