abstract
Diamond and SiC are wide bandgap (WBG) materials which can be used to fabricate high power devices with improved performance. The combination of these materials into one single device is expected to bring some benefits, like a better thermal management with a corresponding increase in the operating power. Diamond films deposited by Chemical Vapor Deposition (CVD) can be doped with boron, making them p-type semiconductors. Diamond films deposited on foreign substrates are intrinsically polycrystalline, so the quality of the interface, determined by deposition conditions and seeding method, plays a critical role in the heterojunction characteristics, impacting both reverse current and breakdown voltage. This work reports the fabrication and characterization of p-diamond / n-SiC heterojunctions. P-type polycrystalline diamond (PCD) films were deposited directly on the surface on n-type SiC commercial wafers by Hot Filament CVD (HFCVD) using different seeding techniques. I-V characteristics of the obtained heterojunctions were measured at room temperature and the quality and morphology of the diamond films were assessed by scanning electronic microscopy (SEM) and Raman spectroscopy. The influence of the different seeding techniques on the I-V characteristics is discussed.
keywords
POLYCRYSTALLINE DIAMOND; SILICON-CARBIDE; RAMAN-SPECTROSCOPY; FILMS; TRANSPORT; CVD
subject category
Computer Science; Engineering
authors
Mukherjee, D; Mendes, JC; Alves, LN; Neto, M; Oliveira, FJ
our authors
Filipe José Alves de Oliveira
Principal Researcher
Joana Isabel Cardoso Mendes
MSc Student