abstract
Domain structure and its evolution on the surface of PLZT 8/65/35 ceramics after selective chemical etching and e-beam irradiation was studied. It is shown that the initial mixture of the nanoscale fractal-type 3D maze (fractal dimension 2.8) and micron-size domains turned into lamellar domains with periods ranging from 100 to 800 nm as a result of such procedures. The observed etch-induced change of the domain structure was attributed to the action of the depolarization field after partial removing the screening charges. The dependence of the switched domain area on irradiation time (dose) was measured in e-beam irradiated samples.
keywords
PIEZORESPONSE FORCE MICROSCOPY; THIN-FILMS; FERROELECTRICS; RELAXATION; DISORDER; KINETICS; STATE
subject category
Materials Science; Physics
authors
Gimadeeva, LV; Shikhova, VA; Chezganov, DS; Merzliakova, AS; Vlasov, EO; Fedorovyh, VV; Kholkin, AL; Malic, B; Shur, VY
our authors
Andrei Kholkin
Principal Researcheracknowledgements
Russian Foundation of Basic Research (Grant 16-02-00821-a). The Government of Russian Federation (Act 211, Agreement 02.A03.21.0006). The Ministry of Education and Science of the Russian Federation (Project No. 1366.2014/236). The project CICECO-Aveiro Institute of Materials (POCI-01-0145-FEDER-007679, FCT Ref. UID/CTM/50011/2013), financed by national funds through the FCT/MEC and, when appropriate, co-financed by FEDER under the PT2020 Partnership Agreement.