Domain Switching by Electron Beam Irradiation in SBN61:Ce Single Crystals Covered by Dielectric Layer
authors Chezganov, DS; Shikhova, VA; Fedorovyh, VV; Vlasov, EO; Chuvakova, MA; Nebogatikov, MS; Zelenovskiy, PS; Kholkin, AL; Ivleva, LI; Shur, VY
nationality International
journal IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
author keywords Cerenkov-type second-harmonic generation microscopy (CSHGM); confocal Raman microscopy (CRM); domain structure; electron beam (e-beam) irradiation; local switching; piezoresponse force microscopy (PFM); polarization reversal; relaxor ferroelectrics; strontium barium niobate
keywords BARIUM NIOBATE CRYSTALS; RAMAN VISUALIZATION; LINBO3; SPECTROSCOPY
abstract The formation of the domain structure by electron beam irradiation in thermally depolarized Ce-doped strontium barium niobate single crystals with free surface and surface covered by a dielectric layer has been studied. The dependences of the domain sizes and domain depth on the irradiated dose have been measured. The circular shape of the isolated domains was obtained. The isotropic domain growth was attributed to step generation at the wall as a result of merging with the residual nanodomains which existed after thermal depolarization. The linear dose dependence of the switched area was attributed to the screening of the depolarization field by the injected charge. The electrostatic interaction of the approaching charged domain walls was revealed. The better quality of the domain patterns was achieved in the samples with electron localization in the dielectric layer. The obtained results can be applied for the creation of precise domain patterns with arbitrary orientation and shape to produce nonlinear optical devices with improved characteristics.
publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
issn 0885-3010
isbn 1525-8955
year published 2020
volume 67
issue 1
beginning page 191
ending page 196
digital object identifier (doi) 10.1109/TUFFC.2019.2938451
web of science category Acoustics; Engineering, Electrical & Electronic
subject category Acoustics; Engineering
unique article identifier WOS:000505579100019
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journal analysis (jcr 2019):
journal impact factor 2.812
5 year journal impact factor 2.873
category normalized journal impact factor percentile 69.637
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