In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever buckling


Rigorous experimental/theoretical approach to measure and to minimize in-plane piezoresponse contribution to the vertical piezoresponse force microscopy (PFM) signal is presented. In-plane piezoresponse mediated by the cantilever buckling is shown to affect apparent vertical PFM signal being of the same order of magnitude as a true out-of-plane piezoresponse. Decoupling of these two contributions based on simple mathematical procedure is demonstrated. Row PFM data are analyzed as a function of the laser beam focus position on the cantilever allowing suppression of buckling contribution and, hence, measurement of only out-of-plane piezoresponse component. This approach can be used for the accurate recovery of the piezoresponse displacement vector, what is of paramount importance for the reconstruction of the domain structures and quantitative characterization of the polarization distribution and local piezoelectric properties in ferroelectric materials.

subject category

Chemistry, Physical; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter


Alikin, DO; Gimadeeva, LV; Ankudinov, AV; Hu, Q; Shur, VY; Kholkin, AL

our authors


The equipment of the Ural Center for Shared Use Modern Nanotechnology UrFU was used. The work of D.O. Alikin and L.V. Gimadeeva is supported by the Russian Science Foundation (grant 19-7210076). We gratefully acknowledge Dr. Alexander Tselev for the useful discussion.

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