Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films

abstract

The structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films.

keywords

LEAD-ZIRCONATE-TITANATE; FERROELECTRIC-FILMS; ELECTRICAL-PROPERTIES; THICKNESS DEPENDENCE; SELF-POLARIZATION; FORCE MICROSCOPY; GEL; PBZR1-XTIXO3; CAPACITORS; STRESS

subject category

Physics

authors

Lima, EC; Araujo, EB; Souza, AG; Paschoal, AR; Bdikin, IK; Kholkin, AL

our authors

acknowledgements

The authors would like to express their gratitude to the Brazilian agencies FAPESP (Processes Nos 2007/08534-3 and 2010/16504-0) and CNPq (Research Grant No 307607/2009-7) for financial support. The authors also thank the Instituto de Pesquisa Desenvolvimento e Inovacao (IPDI) for Raman facilities.

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