Nanoscale characterization of ferroelectric materials for piezoelectric applications

resumo

In this work, the nanoscale electromechanical properties of Pb-based perovskites that are currently the main candidates for piezoelectric applications are investigated by Piezoresponse Force Microscopy (PFM). Local response is compared with that studied via conventional technique. The effect of local polarization switching by mechanical force is demonstrated. This effect may limit the functionality of the films in piezoelectric applications. Local piezoelectric nonlinearity, as well as the nanoscale degradation are also studied by PFM. These measurements demonstrate that the defects may act as pinning centers for domain walls and thus influence nanoscale properties. Finally, local properties of ferroelectric relaxors are presented.

palavras-chave

SCANNING FORCE MICROSCOPY; LEAD-ZIRCONATE-TITANATE; PB(ZR,TI)O-3 THIN-FILMS; FATIGUE; HETEROSTRUCTURES; HYSTERESIS; EVOLUTION; CERAMICS

categoria

Materials Science; Physics

autores

Kholkin, AL; Shvartsman, VV; Kiselev, DA

nossos autores

Partilhe este projeto

Publicações similares

Usamos cookies para atividades de marketing e para lhe oferecer uma melhor experiência de navegação. Ao clicar em “Aceitar Cookies” você concorda com nossa política de cookies. Leia sobre como usamos cookies clicando em "Política de Privacidade e Cookies".