Atomic Force Microscopy (AFM) is a microscopy method that forms images of surfaces using a physical probe that scans the specimen. The interactions between the scanning probe and the sample can be of different natures, such as mechanical, electrical, or magnetic. Measuring the intensity of the interactions, one can obtain information about local sample functional properties with spatial resolution down to a few nanometers. CICECO currently has two dedicated microscopes (both from NT-MDT) that can be used for studying materials and nanostructures.
About Atomic Force Microscopy Facility
Our microscopes provide capabilities to investigate samples under ambient conditions, in low vacuum at pressures down to 10-2 mbar, or in argon atmosphere inside a glovebox. The temperature range is from room temperature up to approximately 200 oC. The magnetic option allows applying an external DC magnetic field up to 0.3 T.
The imaging modes include core AFM modes and functional characterization modes:
1. Core AFM imaging modes
Fundamental operation modes for topographic imaging:
– Contact AFM
– Semi-contact / intermittent contact (tapping / AM-AFM)
2. Ferroelectric modes
– Piezoresponse Force Microscopy (PFM)
3. Electrical and electrostatic modes
For electronic properties mapping:
– Electrostatic Force Microscopy (EFM)
– Kelvin Probe Force Microscopy (KPFM)
– Conductive AFM / current mapping
– Spreading Resistance Imaging (SSRM)
4. Mechanical / force-based modes
Used for surface mechanical characterization:
– Lateral Force Microscopy (LFM)
– Force-distance spectroscopy (AFM spectroscopy)
5. Other modes
– Magnetic Force Microscopy (MFM)
– Scanning Thermal Microscopy (SThM)
Samples can consist of solid organic and inorganic materials in bulk form or as films, as well as nano- or microfibers, or particles fixed on a solid substrate. The maximum sample size is 15 × 15 × 10 mm3 (L × W × H). AFM scan size is up to 100 × 100 × 10 µm3 (X,Y,Z).
Internal services (CICECO and UA members)
Internal users can access the facility through the scientific collaboration framework. Facility staff contribute scientifically (e.g., experimental design and planning, sample preparation, measurements, data analysis and interpretation), and co-authorship is expected when contributions meet academic authorship criteria.
Routine AFM tasks using standard modes (e.g., topography imaging in contact or non-contact regimes) can be carried out by users after appropriate training.
More advanced AFM techniques are addressed on a case-by-case basis. Facility staff will advise on the application of suitable AFM modes to meet the scientific objectives.
External services (outside UA)
External users may access the facility through a service model, where measurements and analyses are performed for a fee. This model does not involve scientific collaboration or authorship.
For industrial and academic users, access may also be provided through a scientific collaboration framework upon mutual agreement.
Alexander Tselev
Scientific Coordinator
Principal Researcher at CICECO and Department of Physics. Most relevant scientific interests: Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials.
Instruments
NTEGRA Aura is a Scanning Probe Microscope for experiments in air, in controlled atmosphere, and in low vacuum conditions. It features all imaging modes listed above, as well as measurements under DC magnetic field. The AFM measurements with NTEGRA Aura can be supported by an external HF2LI Lock-in Amplifier (Zurich Instruments).
Manufacturer’s specifications of the NTEGRA Aura AFM can be found at: https://ntmdt.nl/home/products/ntegra-aura/
The standard measurement head of the AFM was modified in-house to improve the sensitivity and noise characteristics.
NTEGRA Prima AFM is installed in an argon-filled glovebox, which ensures a clean and inert atmosphere for sensitive samples. It supports all measurement modes listed above. The AFM measurements with NTEGRA Prima can be supported by an external HF2LI Lock-in Amplifier (Zurich Instruments).
Manufacturer’s specifications of the NTEGRA Prima AFM can be found at: https://ntmdt.nl/home/products/ntegra-prima/
The standard measurement head of the AFM was modified in-house to improve the sensitivity and noise characteristics.