Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
authors Araujo, EB; Lima, EC; Bdikin, IK; Kholkin, AL
nationality International
journal FERROELECTRICS
author keywords Imprint; PZT; thin films
keywords FERROELECTRIC CAPACITORS; SELF-POLARIZATION; MECHANISMS; BEHAVIOR
abstract Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d(33) before poling with some reports in the literature, the existence of point defects such as complex vacancies (and Ti3+ centers is discussed as probable origin for the imprint effect observed here.
publisher TAYLOR & FRANCIS LTD
issn 0015-0193
year published 2016
volume 498
issue 1
beginning page 18
ending page 26
digital object identifier (doi) 10.1080/00150193.2016.1166421
web of science category Materials Science, Multidisciplinary; Physics, Condensed Matter
subject category Materials Science; Physics
unique article identifier WOS:000377049700003
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journal impact factor 0.669
5 year journal impact factor 0.718
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