Imprint behavior and polarization relaxation of PLZT thin films


Thickness dependence of imprint and polarization dynamics of Pb1-xLax(Zr1-yTiy)(1-x/4)O-3 (PLZT) thin films is reported in this work. Asymmetries in the histograms of the local piezoresponse reveal an imprint effect in the studied films whose origin could be associated to Schottky barriers near the film-substrate interface. Time-resolved spectroscopic measurements shows that the local polarization relaxation follows the exponential dependence . A maximum relaxation time approximate to 2.18s was observed for the 350nm thick film. A similar thickness dependence between grain size, correlation length () and relaxation time () suggest an intrinsic relationship between them.



subject category

Materials Science; Physics


Araujo, EB; Melo, M; Ivanov, M; Shur, VY; Kholkin, AL

our authors


We would like to express our gratitude to the Brazilian agencies CNPq (Grant 304604/2015-1 and Project 400677/2014-8), CAPES and FAPESP for financial support. M.M. thanks to CNPq for his sandwich PhD fellowship (232241/2014-7). Portions of this work were supported by Government of the Russian Federation (Grant 16-02-00821-a and Act 211, Agreement 02. A03.21.0006) and also developed in the scope of Project CICECO-Aveiro Institute of Materials (ref. FCT UID/CTM/50011/2013), financed by national funds through the FCT/MEC and, when applicable, co-financed by FEDER under the PT2020 Partnership Agreement.

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