Twinning and domain structure of epitaxial YBa2Cu3Ox films studies by X-ray diffraction methods
authors Bdikin, IK; Mozhaev, PB; Mozhaeva, YE; Ovsyannikov, GA; Komissinski, PV; Kotelyanskii, IM; Kholkin, AL
nationality International
author keywords Domains; Multilayers; Twinning; X-ray diffraction; Thin films; Oxide superconducting materials
abstract Structure, orientational features, and twinning of epitaxial superconductive YBa2Cu3Ox (YBCO) thin films and YBCO/CeO2 heterostructures on (1 1 0) NdGaO3 (NGO) and tilted-axes NdGaO3 substrates with an inclination of normal of the substrate from the [1 1 0] axis were investigated by X-ray diffraction methods. Orthorhombic structure of NdGaO3 results in an increase of the angle between (1 1 0) and (1 (1) under bar 0) twinning planes in YBCO films to 90.20 degrees and in a difference in volume of two twin domain systems. The orientation of epitaxial YBCO thin films was shown to be influenced by the deposition rate and the presence of symmetrical-equivalent directions [1 1 0] and [1 (1) under bar 0] in the substrate and [1 0 0], [0 1 0], and [0 0 1] in the CeO2 layer. Domain structure of the YBCO thin film changes with an increase in the inclination angle. The YBCO thin films on the tilted-axes substrates are twinned in the same way as on (1 1 0) NGO substrates. However, formation of one or both twinning complexes is suppressed with an increase of the inclination angle. (C) 2004 Elsevier B. V. All rights reserved.
issn 0022-0248
year published 2005
volume 275
issue 1-2
beginning page E2475
ending page E2480
digital object identifier (doi) 10.1016/j.jcrysgro.2004.11.380
web of science category Crystallography; Materials Science, Multidisciplinary; Physics, Applied
subject category Crystallography; Materials Science; Physics
unique article identifier WOS:000208324600400
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