Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
authors Balke, N; Bdikin, I; Kalinin, SV; Kholkin, AL
nationality International
journal JOURNAL OF THE AMERICAN CERAMIC SOCIETY
keywords SCANNING FORCE MICROSCOPY; LEAD-ZIRCONATE-TITANATE; NONLINEAR DIELECTRIC MICROSCOPY; PBZRXTI1-XO3 THIN-FILMS; PROBE MICROSCOPY; SINGLE-CRYSTALS; PHASE-TRANSITION; BATIO3 CERAMICS; RELAXOR FERROELECTRICS; POLARIZATION FATIGUE
abstract Piezoresponse force microscopy (PFM) has emerged as a powerful and versatile tool for probing nanoscale phenomena in ferroelectric materials on the nanometer and micrometer scales. In this review, we summarize the fundamentals and recent advances in PFM, and describe the nanoscale electromechanical properties of several important ferroelectric ceramic materials widely used in memory and microelectromechanical systems applications. Probing static and dynamic polarization behavior of individual grains in PZT films and ceramics is discussed. Switching spectroscopy PFM is introduced as a useful tool for studying defects and interfaces in ceramic materials. The results on local switching and domain pinning behavior, as well as nanoscale fatigue and imprint mapping are presented. Probing domain structures and polarization dynamics in polycrystalline relaxors (PMN-PT, PLZT, doped BaTiO3) are briefly outlined. Finally, applications of PFM to dimensionally confined ferroelectrics are demonstrated. The potential of PFM for studying local electromechanical phenomena in polycrystalline ferroelectrics where defects and other inhomogeneities are essential for the interpretation of their macroscopic properties is illustrated.
publisher WILEY-BLACKWELL
issn 0002-7820
year published 2009
volume 92
issue 8
beginning page 1629
ending page 1647
digital object identifier (doi) 10.1111/j.1551-2916.2009.03240.x
web of science category Materials Science, Ceramics
subject category Materials Science
unique article identifier WOS:000268704600001
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journal analysis (jcr 2019):
journal impact factor 3.502
5 year journal impact factor 3.475
category normalized journal impact factor percentile 91.071
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