Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires

resumo

Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using An electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses. Microsc. Res. Tech. 72:93-100, 2009. (C) 2008 Wiley-Liss, Inc.

palavras-chave

CARBON NANOTUBES; FIELD-EMISSION; FILMS; NANOWIRES; TRANSPORT

categoria

Anatomy & Morphology; Life Sciences & Biomedicine - Other Topics; Microscopy

autores

Costa, PMFJ; Fang, XS; Wang, SL; He, YH; Bando, Y; Mitome, M; Zou, J; Huang, H; Golberg, D

nossos autores

Grupos

agradecimentos

Contract grant sponsor: National Institute for Materials Science, Japan [World Premier International Center for Materials Nanoarchitectonics (MANA) and the Nanoscale Materials Center projects].

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