Synchrotron diffraction study of high-pressure C-60 polymerization
authors Marques, L; Mezouar, M; Hodeau, JL
nationality International
author keywords fullerite; high pressure; high temperature; X-ray diffraction
abstract C60 polymerization under high pressure and high temperature was studied in situ by angle-dispersive synchrotron diffraction employing a two-dimensional (2D) image plate detector. Preliminary results of this study show that heating fullerene C60 up to 450 degrees C at 7GPa leads essentially to the well-known rhombohedral 2D-polymerized phase. In addition, in situ diffraction measurements show that the texture exhibited by the transformed sample results from the anisotropic polymerization occurring on the sample, which in turn is induced by the uniaxial stress component of the applied pressure. The polymerized lattice planes in the transformed sample are then aligned to the compression (uniaxial) axis. Diffraction analysis of the recovered sample has permitted us to identify the presence of a minor phase, the tetragonal 2D polymer.
issn 0895-7959
year published 2009
volume 29
issue 4
beginning page 564
ending page 568
digital object identifier (doi) 10.1080/08957950903350967
web of science category Physics, Multidisciplinary
subject category Physics
unique article identifier WOS:000274675700019
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