Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

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abstract

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography

authors

Kholkin A L , Kalinin S V, Roelofs A

our authors

foto Andrei Kholkin

Andrei Kholkin

Principal Researcher

Groups

2 - multifunctional ferroic ceramics and nanostructures

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Publication Details

type
Book Chapter
year
2007
Book Title
Scanning Probe Microscopy - Electrical and Electromechanical Phenomena at the Nanoscale
editors
Kalinin SV, Gruverman A
publisher
Springer
isbn
978-0-387-28667-9

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