Scanning Probe Microscopy - Electrical and Electromechanical Phenomena at the Nanoscale
| authors | Kholkin A L , Kalinin S V, Roelofs A |
| editors | Kalinin SV, Gruverman A |
| chapter title | Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy |
| author keywords | AFM - KLTcatalog - Microscopy - Nanotube - PED - Polymer - REM - STEM - STM - carbon nanotubes - electronics - mechanics - polymers - spectroscopy - ultrasound |
| abstract | Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography |
| publisher | Springer |
| isbn | 978-0-387-28667-9 |
| year published | 2007 |
| beginning page | 173 |
| ending page | 214 |
