Physical properties of strontium barium niobate thin films prepared by polymeric chemical method

abstract

Randomly oriented Sr0.75Ba0.25Nb2O6 thin films have been deposited on Pt(111)/Ti/SiO2/Si substrates using a polymeric chemical method to study their physical properties. Refinements of the structure confirm the stoichiometry of the studied films. The relaxor behavior is evidenced by the dielectric measurements and Vogel-Fulcher analysis of the dielectric curves. Lowering the transition temperature (T-m) by about 100K and asymmetries in the local hysteresis loops well above T-m are discussed in terms of the existence of complex defects in thin films.

keywords

PULSED-LASER DEPOSITION; RELAXOR FERROELECTRICS; DIELECTRIC-RELAXATION; ELECTRICAL-PROPERTIES; RIETVELD REFINEMENT; OPTICAL-PROPERTIES; VAPOR-DEPOSITION; BEHAVIOR; IMPRINT; GROWTH

subject category

Materials Science; Physics

authors

Melo, M; Araujo, EB; Turygin, AP; Shur, VY; Kholkin, AL

our authors

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