abstract
Crystalline Eu3+-2-aminoterephthalic acid thin (ca. 22 mu m) films have been prepared by Atomic/Molecular Layer Deposition (ALD/MLD) on Si/SiO2 substrates. The beta-diketonate complex precursor europium(III)-tris(2,2,6,6-tetramethyl-3,5-heptanedionate, Eu(thd)(3), was reacted with 2-aminoterephthalic acid, NH(2)TA. X-ray diffraction indicates the films deposited at 180 degrees C exhibit the structure of UiO-66, a Zr-bearing metal organic framework. Scanning electron microscopy and atomic force microscopy show that the prepared films are very smooth and uniform, essentially defect-free, with a surface topography comprising evenly distributed hills without sharp edges, well adherent to the substrate. Attenuated total reflectance fourier transform infrared witnesses the presence of the organic ligand in the film and its coordination to the metal. X-ray photoelectron spectroscopy confirms the trivalent Eu oxidation state. Due to their thermal stability, fair volatility and facile synthesis, beta-diketonate complexes have been shown to be suitable ALD precursors for preparing high-quality lanthanide organic framework thin films, enabling a single-step gas phase method for the synthesis of luminescent films.
keywords
ATOMIC/MOLECULAR LAYER DEPOSITION; INORGANIC MATERIALS; PRECURSORS
subject category
Chemistry; Materials Science; Physics
authors
Silva, RM; Carlos, LD; Rocha, J; Silva, RF
our authors
João Rocha
Full Professoracknowledgements
This work was developed within the scope of the project CICECO-Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when appropriate co-financed by FEDER under the PT2020 Partnership Agreement. R.M. Silva is very grateful to CICECO - Aveiro Institute of Materials for the postdoctoral fellowship BPD/UI89/5196/2017. The authors acknowledge Dr. R. Soares and Dr. A.V. Girao for assistance with the XRD/GIXRD and SEM studies, respectively.