Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique
authors Boerasu, I; Pereira, M; Vasilevskiy, M; Gomes, MJM; Watts, B; Leccabue, F; Vilarinho, PM
nationality International
journal APPLIED SURFACE SCIENCE
author keywords PZTN film; laser ablation; optical properties; effective dielectric function
keywords THIN-FILMS; DEPOSITION
abstract According to the general formula Pb1-x/2(Zr0.65Ti0.35)(1-x) Nb-x O-3 + 4 mol% PbO excess (X = 1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(1 0 0) substrates using either a Nd:YAG (355 nm) or a XeCl (308 nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. (C) 2002 Elsevier Science B.V. All rights reserved.
publisher ELSEVIER SCIENCE BV
issn 0169-4332
year published 2003
volume 208
beginning page 604
ending page 610
digital object identifier (doi) 10.1016/S0169-4332(02)01400-9
web of science category Chemistry, Physical; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter
subject category Chemistry; Materials Science; Physics
unique article identifier WOS:000181871200100
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