Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue
authors Zhang, Y; Baturin, IS; Aulbach, E; Lupascu, DC; Kholkin, AL; Shur, VY; Rodel, J
nationality International
journal APPLIED PHYSICS LETTERS
keywords THIN-FILM CAPACITORS; POLARIZATION FATIGUE; PB(ZR,TI)O-3 FILMS; SUPPRESSION; CERAMICS
abstract Hysteresis loops of the piezoelectric coefficient, d(33)=f(E-3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field E-b, offset piezoelectric coefficient d(offset), coercive field E-c, and remnant piezoelectric coefficient d(r). The reduction in d(r) displays the decreasing switchable polarization with fatigue cycling. E-b and d(offset) are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in E-c and the reduction in d(r) withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching. (C) 2005 American Institute of Physics.
publisher AMER INST PHYSICS
issn 0003-6951
year published 2005
volume 86
issue 1
digital object identifier (doi) 10.1063/1.1847712
web of science category Physics, Applied
subject category Physics
unique article identifier WOS:000226701200075
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