Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue

abstract

Hysteresis loops of the piezoelectric coefficient, d(33)=f(E-3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field E-b, offset piezoelectric coefficient d(offset), coercive field E-c, and remnant piezoelectric coefficient d(r). The reduction in d(r) displays the decreasing switchable polarization with fatigue cycling. E-b and d(offset) are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in E-c and the reduction in d(r) withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching. (C) 2005 American Institute of Physics.

keywords

THIN-FILM CAPACITORS; POLARIZATION FATIGUE; PB(ZR,TI)O-3 FILMS; SUPPRESSION; CERAMICS

subject category

Physics

authors

Zhang, Y; Baturin, IS; Aulbach, E; Lupascu, DC; Kholkin, AL; Shur, VY; Rodel, J

our authors

Share this project:

Related Publications

We use cookies for marketing activities and to offer you a better experience. By clicking “Accept Cookies” you agree with our cookie policy. Read about how we use cookies by clicking "Privacy and Cookie Policy".