On the Growth and Physical-chemical Characterization of Tb5Si2Ge2 Thin Films Produced by Electron-beam Evaporation
authors A.L.Pires, J.H.Belo, I.T.Gomes, L.Fernandes, P.B.Tavares, A.M.L.Lopesa, A.M.Pereira, J.P.Araújo
nationality International
journal Materials Today: Proceedings
year published 2015
digital object identifier (doi) https://doi.org/10.1016/j.matpr.2015.04.004
link https://www.sciencedirect.com/science/article/pii/S221478531500005X?via%3Dihub
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