resumo
Different thickness of polycrystalline ZnTe films have been deposited onto glass substrates at room temperature by vacuum evaporation technique. The structural characteristics studied by X-ray diffraction (XRD) showed that the films are polycrystalline and have a zinc blende (cubic) structure. The calculated microstructure parameters revealed that the crystallite size increases and microstrain decreases with increasing film thickness. The transmittance and reflectance have been measured at normal and near normal incidence, respectively, in the spectral range 400-2500 nm. For ZnTe films of different thicknesses, the dependence of absorption coefficient, a on the photon energy showed the occurrence of a direct transition with band gap energy E(g)(opt) = 2.21 +/- 0.01 eV (For ZnTe films of different thicknesses) confirming the independency of deduced energy gap on film thickness. The refractive indices have been evaluated in terms of envelope method, which has been suggested by Swanepoul in the transparent region. The refractive index could be extrapolated by Cauchy dispersion relationship over the whole spectra range, which extended from 400 to 2500 nm. It was observed that the refractive index, n increased upon increasing the film thickness up to 508 nm, lying within the experimental error for further increases in film thickness. (C) 2009 Elsevier B.V. All rights reserved.
palavras-chave
ELECTRICAL-PROPERTIES; ZINC TELLURIDE; SEMICONDUCTORS; SPECTRA
categoria
Physics
autores
Shaaban, ER; Kansal, I; Mohamed, SH; Ferreira, JMF
nossos autores
José Maria da Fonte Ferreira
Professor(a) Jubilado(a)agradecimentos
The authors are grateful to Al-Azhar University Faculty of Science Physics Department Assuit branch for financial support. The support of CICECO is also acknowledged.