Local Electromechanical Response in Doped Ceria: Rigorous Analysis of the Phase and Amplitude

authors	Alikin, DO; Slautin, BN; Ushakov, AD; Shur, VY; Mishuk, E; Lubomirsky, I; Tselev, A; Kholkin, AL
nationality	International
journal	IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
author keywords	cerium oxide; electrochemical strain microscopy; electrostriction; oxygen vacancies; phase
abstract	Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the 'non-Newnham''-type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30-300 degrees C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.
publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
issn	1070-9878
isbn	1558-4135
year published	2020
volume	27
issue	5
beginning page	1478
ending page	1485
digital object identifier (doi)	10.1109/TDEI.2020.008942
web of science category	Engineering, Electrical & Electronic; Physics, Applied
subject category	Engineering; Physics
unique article identifier	WOS:000588020500016