Alexander Tselev

Principal Researcher

Short CV

Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)
Professional Experience 
2016 – present Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal
2009–2016 Research Assistant Professor, Joint Faculty, Oak Ridge National Laboratory/University of Tennessee, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory and Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 
2006–2009 Research Associate, Duke University, Durham, NC, USA
2003–2006 Post Doctoral Fellow, Georgetown University , Washington, DC, USA
2001–2003 Post Doctoral Research Associate, University of Maryland College Park, MD, USA 
1997–2001 Scientific Employee, Dresden University of Technology, Germany
1991–1997 Junior Research Scientist, Institute of Applied Physics / Institute for Physics of Microstructures, Russian Academy of Sciences, Russia
Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.
Honors and Awards

2017 Tan Chin Tuan Exchange Fellowship in Engineering, Nanyang Technological University, Singapore

European Materials Research Society (E-MRS) Graduate Student Award (1998).
Research Synopsis 

  1. Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials. 
  2. Near-field scanning microwave microscopy. We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors, including in-situ imaging in fluids.
  3. Physics of nanoscale phase transitions and heat transport
  4. Materials for information storage
  5. Materials for energy storage and conversion 
  6. In-situ Scanning Probe Microscopy of Complex Oxides. In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition / Laser MBE. 



Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy

Alikin, D; Abramov, A; Turygin, A; Ievlev, A; Pryakhina, V; Karpinsky, D; Hu, QY; Jin, L; Shur, V; Tselev, A; Kholkin, A
2022, SMALL METHODS, 6, 2.

Influence of voltage amplitude parameters on the electrocaloric response in ferroelectric materials

Es'kov, AV; Anokhin, AS; Pakhomov, OV; Kholkin, A; Tselev, A; Ondrejkovic, P
2022, FERROELECTRICS, 591, 1, 43-50.

Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin Film

Burns, SR; Tselev, A; Ievlev, AV; Agar, JC; Martin, LW; Kalinin, SV; Sando, D; Maksymovych, P

Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam

Seol, D; Kim, S; Jang, WS; Jin, Y; Kang, S; Kim, S; Won, D; Lee, C; Kim, YM; Lee, J; Yang, H; Jeong, MS; Belianinov, A; Tselev, A; Somnath, S; Smith, CR; Ovchinnikova, OS; Balke, N; Kim, Y
2021, NANO ENERGY, 79.
ISBN: 2211-3282

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

Romanyuk, KN; Alikin, DO; Slautin, BN; Tselev, A; Shur, VY; Kholkin, AL
ISBN: 1879-2723

Statics and dynamics of ferroelectric domains in molecular multiaxial ferroelectric (Me3NOH)(2)[KCo(CN)(6)]

Xu, WJ; Romanyuk, K; Zeng, Y; Ushakov, A; Shur, V; Tselev, A; Zhang, WX; Chen, XM; Kholkin, A; Rocha, J
2021, JOURNAL OF MATERIALS CHEMISTRY C, 9, 33, 10741-10748.
ISBN: 2050-7534

Multiferroic properties of barium strontium titanate ceramics doped with gadolinium and iron

Es'kov, AV; Anokhin, AS; Pakhomov, OV; Semenov, AA; Fadeev, E; Dedyk, A; Kholkin, A; Tselev, A; Baranov, IV; Lahderanta, E
2021, FERROELECTRICS, 574, 1, 109-114.
ISBN: 1563-5112

Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy

H.Guo, A.Yulaev, E.Strelcov, A.Tselev, Ch.Arble, A.E.Vladar, J.S.Villarrubia, A.Kolmakov
2020, ACS Applied Materials & Interfaces.

Nanoscale Mapping of the Double Layer Potential at the Graphene- Electrolyte Interface

Strelcov, E; Arble, C; Guo, HX; Hoskins, BD; Yulaev, A; Vlassiouk, IV; Zhitenev, NB; Tselev, A; Kolmakov, A
2020, NANO LETTERS, 20, 2, 1336-1344.
ISBN: 1530-6992

Tracking ion intercalation into layered Ti3C2 MXene films across length scales

Gao, Q; Sun, WW; Ilani-Kashkouli, P; Tselev, A; Kent, PRC; Kabengi, N; Naguib, M; Alhabeb, M; Tsai, WY; Baddorf, AP; Huang, JS; Jesse, S; Gogotsi, Y; Balke, N
2020, ENERGY & ENVIRONMENTAL SCIENCE, 13, 8, 2549-2558.
ISBN: 1754-5706

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