Alexander Tselev

Principal Researcher

Contact

Department

  • Physics
  • 13.3.32.4

Research

Links

Latest News

Short CV

Education  
Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)
 
Professional Experience 
2016 – present Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal
2009–2016 Research Assistant Professor, Joint Faculty, Oak Ridge National Laboratory/University of Tennessee, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory and Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 
2006–2009 Research Associate, Duke University, Durham, NC, USA
2003–2006 Post Doctoral Fellow, Georgetown University , Washington, DC, USA
2001–2003 Post Doctoral Research Associate, University of Maryland College Park, MD, USA 
1997–2001 Scientific Employee, Dresden University of Technology, Germany
1991–1997 Junior Research Scientist, Institute of Applied Physics / Institute for Physics of Microstructures, Russian Academy of Sciences, Russia
 
Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.
 
Honors and Awards

2017 Tan Chin Tuan Exchange Fellowship in Engineering, Nanyang Technological University, Singapore

European Materials Research Society (E-MRS) Graduate Student Award (1998).
   
Research Synopsis 

  1. Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials. 
  2. Near-field scanning microwave microscopy. We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors, including in-situ imaging in fluids.
  3. Physics of nanoscale phase transitions and heat transport
  4. Materials for information storage
  5. Materials for energy storage and conversion 
  6. In-situ Scanning Probe Microscopy of Complex Oxides. In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition / Laser MBE. 

Projects

Publications

Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy

Alikin, D; Abramov, A; Turygin, A; Ievlev, A; Pryakhina, V; Karpinsky, D; Hu, QY; Jin, L; Shur, V; Tselev, A; Kholkin, A
2022, SMALL METHODS, 6, 2.

Influence of voltage amplitude parameters on the electrocaloric response in ferroelectric materials

Es'kov, AV; Anokhin, AS; Pakhomov, OV; Kholkin, A; Tselev, A; Ondrejkovic, P
2022, FERROELECTRICS, 591, 1, 43-50.

Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin Film

Burns, SR; Tselev, A; Ievlev, AV; Agar, JC; Martin, LW; Kalinin, SV; Sando, D; Maksymovych, P
2022, ADVANCED ELECTRONIC MATERIALS, 8, 3.

Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam

Seol, D; Kim, S; Jang, WS; Jin, Y; Kang, S; Kim, S; Won, D; Lee, C; Kim, YM; Lee, J; Yang, H; Jeong, MS; Belianinov, A; Tselev, A; Somnath, S; Smith, CR; Ovchinnikova, OS; Balke, N; Kim, Y
2021, NANO ENERGY, 79.
ISBN: 2211-3282

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

Romanyuk, KN; Alikin, DO; Slautin, BN; Tselev, A; Shur, VY; Kholkin, AL
2021, ULTRAMICROSCOPY, 220.
ISBN: 1879-2723

Statics and dynamics of ferroelectric domains in molecular multiaxial ferroelectric (Me3NOH)(2)[KCo(CN)(6)]

Xu, WJ; Romanyuk, K; Zeng, Y; Ushakov, A; Shur, V; Tselev, A; Zhang, WX; Chen, XM; Kholkin, A; Rocha, J
2021, JOURNAL OF MATERIALS CHEMISTRY C, 9, 33, 10741-10748.
ISBN: 2050-7534

Multiferroic properties of barium strontium titanate ceramics doped with gadolinium and iron

Es'kov, AV; Anokhin, AS; Pakhomov, OV; Semenov, AA; Fadeev, E; Dedyk, A; Kholkin, A; Tselev, A; Baranov, IV; Lahderanta, E
2021, FERROELECTRICS, 574, 1, 109-114.
ISBN: 1563-5112

Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy

H.Guo, A.Yulaev, E.Strelcov, A.Tselev, Ch.Arble, A.E.Vladar, J.S.Villarrubia, A.Kolmakov
2020, ACS Applied Materials & Interfaces.

Nanoscale Mapping of the Double Layer Potential at the Graphene- Electrolyte Interface

Strelcov, E; Arble, C; Guo, HX; Hoskins, BD; Yulaev, A; Vlassiouk, IV; Zhitenev, NB; Tselev, A; Kolmakov, A
2020, NANO LETTERS, 20, 2, 1336-1344.
ISBN: 1530-6992

Tracking ion intercalation into layered Ti3C2 MXene films across length scales

Gao, Q; Sun, WW; Ilani-Kashkouli, P; Tselev, A; Kent, PRC; Kabengi, N; Naguib, M; Alhabeb, M; Tsai, WY; Baddorf, AP; Huang, JS; Jesse, S; Gogotsi, Y; Balke, N
2020, ENERGY & ENVIRONMENTAL SCIENCE, 13, 8, 2549-2558.
ISBN: 1754-5706

Landau-Ginzburg-Devonshire Theory for domain wall conduction and observation of microwave conduction of domain walls

In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls : From Fundamental Properties to Nanotechnology Concepts
A. Tselev, A. V. Ievlev, R. Vasudevan, S. V. Kalinin, P. Maksymovych, and A. Morozovska
2020, Oxford, United Kingdom : Oxford University Press.
ISBN: 9780198862499

Nanoscale ferroelectric switching: A method to inject and study non-equilibrium domain walls

In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls: From Fundamental Properties to Nanotechnology Concepts
A.V. Ievlev, A. Tselev, R. Vasudevan, S.V. Kalinin, A. Morozovska, and P. Maksymovych
2020, 245, Oxford, United Kingdom: Oxford University Press.
ISBN: 9780198862499

Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale

In Nini Pryds, Vincenzo Esposito (Eds.), Metal Oxide-Based Thin Film Structures
N.Balke, A.Tselev
2018, 181-201, Elsevier.
ISBN: 978-0-12-811166-6

We use cookies for marketing activities and to offer you a better experience. By clicking “Accept Cookies” you agree with our cookie policy. Read about how we use cookies by clicking "Privacy and Cookie Policy".


Privacy and Cookie Policy

Personal data

CICECO-Aveiro Institute of Materials respects your privacy, ensuring confidentiality of personal data you share with the institution through this way, not collecting any personal information about you without your consent, under the terms required by General Data Protection Regulations (RGPD).

The data collected in forms are intended exclusively for processing user requests and will not be used for any other purpose, always safeguarding their confidentiality, under the terms of the protection conferred by the aforementioned regulation.

The collection and processing of data is the responsibility of CICECO and its storage is properly protected, only authorized CICECO employees can access the information within the scope of their functions, always being clear in the respective collection forms the purposes for which they are intended. The remaining issues to be considered in this matter will be handled by the University of Aveiro in accordance with the regime established by the GDPR.

Cookies policy

Cookies are small files with alphanumeric information that are stored on your computer's hard drive by your browser and are intended to improve the user experience and enhance website navigation.

Collection and use of technical information

The cookies used on CICECO are anonymous, and no information about our users that allows their personal identification is stored in them.

The technical information recorded consists of:

  • iP (Internet Protocol) address of the visitor;
  • the type of internet browser used by the website visitor and the respective operating system used;
  • the date and time of the consultation;
  • the pages visited on the site and the documents downloaded
  • The technical information collected is used for statistical purposes only.

Cookies used

Session cookies

These cookies are used to record user preferences, such as the language in which websites are displayed or to maintain authenticated user sessions, and are automatically deleted when the browser is closed.

Persistent cookies

These cookies store information that is needed between sessions. For example, a persistent cookie is set to record that you have been made aware of the cookie policy so that the message regarding this policy is not shown again the next time you visit the website. This cookie remains on the computer until it reaches its expiry date or is deleted by the user.

Data protection

The present privacy policy covers the Information System of the University of Aveiro (SIUA), governed by the General Data Protection Regulations (RGPD) Regulation (EU) No. 2016/679, of April 27th, 2016.

Data Protection Officer

The University of Aveiro has a Data Protection Officer (DPO), who ensures compliance of the processing of personal data with the legislation in force, and is available through the following email address epd@ua.pt.

Close