Alexander Tselev

Investigador Principal

Short CV

Education  
Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude)
Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude)
 
Professional Experience 

2016 – present Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal 
2009–2016 Research Assistant Professor, Joint Faculty, Oak Ridge National Laboratory/University of Tennessee, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory and Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 
2006–2009 Research Associate, Duke University, Durham, NC, USA 
2003–2006 Post Doctoral Fellow, Georgetown University , Washington, DC, USA 
2001–2003 Post Doctoral Research Associate, University of Maryland College Park, MD, USA  
1997–2001 Scientific Employee, Dresden University of Technology, Germany 
1991–1997 Junior Research Scientist, Institute of Applied Physics / Institute for Physics of Microstructures, Russian Academy of Sciences, Russia 

Professional and Synergistic Activities
Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals.
 
Honors and Awards

2017 Tan Chin Tuan Exchange Fellowship in Engineering, Nanyang Technological University, Singapore
European Materials Research Society (E-MRS) Graduate Student Award (1998).
   
Research Synopsis

  1. Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials. 
  2. Near-field scanning microwave microscopy. We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors, including in-situ imaging in fluids.
  3. Physics of nanoscale phase transitions and heat transport
  4. Materials for information storage
  5. Materials for energy storage and conversion 
  6. In-situ Scanning Probe Microscopy of Complex Oxides. In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition / Laser MBE. 

Projectos

Publicações

A hybrid double perovskite ferroelastic exhibiting the highest number of orientation states

Xu, WJ; Zelenovskii, P; Tselev, A; Verissimo, L; Romanyuk, K; Yuan, W; Zhang, WX; Kholkin, A; Rocha, J
2023, CHEMICAL COMMUNICATIONS, 59, 75, 11264-11267.

Quantitative Characterization of Local Thermal Properties in Thermoelectric Ceramics Using "Jumping-Mode" Scanning Thermal Microscopy

Alikin, D; Zakharchuk, K; Xie, WJ; Romanyuk, K; Pereira, MJ; Arias-Serrano, BI; Weidenkaff, A; Kholkin, A; Kovalevsky, AV; Tselev, A
2023, SMALL METHODS, 7, 4.

Molecular Design of a Metal-Nitrosyl Ferroelectric with Reversible Photoisomerization

Xu, WJ; Li, MF; Garcia, AR; Romanyuk, K; Martinho, JMG; Zelenovskii, P; Tselev, A; Verissimo, L; Zhang, WX; Chen, XM; Kholkin, A; Rocha, J
2023, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 145, 25, 13663-13673.

Polarization-controlled volatile ferroelectric and capacitive switching in Sn2P2S6

Neumayer, SM; Ievlev, A; Tselev, A; Basun, SA; Conner, BS; Susner, MA; Maksymovych, P
2023, NEUROMORPHIC COMPUTING AND ENGINEERING, 3, 1.

Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy

Alikin, D; Abramov, A; Turygin, A; Ievlev, A; Pryakhina, V; Karpinsky, D; Hu, QY; Jin, L; Shur, V; Tselev, A; Kholkin, A
2022, SMALL METHODS, 6, 2.

Influence of voltage amplitude parameters on the electrocaloric response in ferroelectric materials

Es'kov, AV; Anokhin, AS; Pakhomov, OV; Kholkin, A; Tselev, A; Ondrejkovic, P
2022, FERROELECTRICS, 591, 1, 43-50.

Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin Film

Burns, SR; Tselev, A; Ievlev, AV; Agar, JC; Martin, LW; Kalinin, SV; Sando, D; Maksymovych, P
2022, ADVANCED ELECTRONIC MATERIALS, 8, 3.

Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beam

Seol, D; Kim, S; Jang, WS; Jin, Y; Kang, S; Kim, S; Won, D; Lee, C; Kim, YM; Lee, J; Yang, H; Jeong, MS; Belianinov, A; Tselev, A; Somnath, S; Smith, CR; Ovchinnikova, OS; Balke, N; Kim, Y
2021, NANO ENERGY, 79.
ISBN: 2211-3282

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

Romanyuk, KN; Alikin, DO; Slautin, BN; Tselev, A; Shur, VY; Kholkin, AL
2021, ULTRAMICROSCOPY, 220.
ISBN: 1879-2723

Statics and dynamics of ferroelectric domains in molecular multiaxial ferroelectric (Me3NOH)(2)[KCo(CN)(6)]

Xu, WJ; Romanyuk, K; Zeng, Y; Ushakov, A; Shur, V; Tselev, A; Zhang, WX; Chen, XM; Kholkin, A; Rocha, J
2021, JOURNAL OF MATERIALS CHEMISTRY C, 9, 33, 10741-10748.
ISBN: 2050-7534

Introduction to the electrocaloric effect

In A. L. Kholkin, O. V. Pakhomov, A. A. Semenov, A. Tselev (Eds.), The Electrocaloric Effect: Materials and Applications
Kholkin A.L.; Tselev A.; Semenov A.A.; Pakhomov O.V.
2023, The Electrocaloric Effect: Materials and Applications, 3-7, Elsevier.
ISBN: 978-012821647-7; 978-012821648-4

Electrocaloric-based applications: Challenges and perspectives

In A. L. Kholkin, O. V. Pakhomov, A. A. Semenov, A. Tselev (Eds.), The Electrocaloric Effect: Materials and Applications
Kholkin A.L.; Kopyl S.; Tselev A.; Suchaneck G.
2023, The Electrocaloric Effect: Materials and Applications, 407-425, Elsevier.
ISBN: 978-012821647-7; 978-012821648-4

Landau-Ginzburg-Devonshire Theory for domain wall conduction and observation of microwave conduction of domain walls

In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls : From Fundamental Properties to Nanotechnology Concepts
A. Tselev, A. V. Ievlev, R. Vasudevan, S. V. Kalinin, P. Maksymovych, and A. Morozovska
2020, Oxford, United Kingdom : Oxford University Press.
ISBN: 9780198862499

Nanoscale ferroelectric switching: A method to inject and study non-equilibrium domain walls

In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls: From Fundamental Properties to Nanotechnology Concepts
A.V. Ievlev, A. Tselev, R. Vasudevan, S.V. Kalinin, A. Morozovska, and P. Maksymovych
2020, 245, Oxford, United Kingdom: Oxford University Press.
ISBN: 9780198862499

Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale

In Nini Pryds, Vincenzo Esposito (Eds.), Metal Oxide-Based Thin Film Structures
N.Balke, A.Tselev
2018, 181-201, Elsevier.
ISBN: 978-0-12-811166-6

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